The surface analytics facility provides state-of-the-art instrumentations and expertise in the fields optical and electron spectroscopies, as well as nanoscale imaging and force spectroscopy. The instrumentation is mostly dedicated to the analysis of powders, thin films and bulk materials. It comprises:
- Photoelectron spectroscopy – XPS, ARXPS, UPS: quantitative measurement of surface atomic composition and chemical state analysis.
- Auger electron spectroscopy – AES: nanoscale imaging and spectroscopy of surface composition.
- Raman: molecular determination by assessing vibrational fingerprints – Raman
Most of these instruments are in open-access after a successful training.
Measurements from the family of Scanning Probe Microscopy techniques such as AFM for the study of surface topography, SNOM for the nanoscale imaging and spectroscopy of photoluminescence and fluorescence, STM to assess the electronic density of states at the nanoscale and spatially resolved Raman spectroscopy TERS are also available either as a service or through the organisation of collaborations.
For measurements requests – be it for academia or industry – please contact Mounir Mensi.
Instruments:
XPS/UPS – AES: Kratos Axis Supra
- Monochromated Al Ka X-ray source
- Monochromated Ag La X-ray source
- He(I) and He(II) UV source for UPS
- Ar+ sputter gun
- FEG electron gun for AES and Auger microscopy, spot size ~100nm.
- Heat-cool sample stage: LN2 – 600°C
- Transfer vessel for air sensitive samples
NAP-XPS: SPECS
- Monochromated Al Ka X-ray source
- Non-monochromated Mg Ka X-ray source
- NAP cell pressure up to 10 mbar
- He(I) and He(II) UV source
- Sample preparation chamber (sputtering, ESD, heat-cool)
- Connected under vacuum to an STM (SPECS/Nanonis, Colibri sensor)
Confocal Raman microscope: Renishaw inVia
- 457nm, 532nm and 632nm lasers
- Confocal mode: signal discrimination based spatial position
- Time series: monitor how your sample is altering with time
- Automated sample stage for surface/volume mapping
- Molecular and elements database and spectral recognition
- Heat-cool gas cell available in a collaboration scheme
TERS: Nanonics Multiview / Renishaw InVia
- 457nm, 532nm and 632nm lasers
- Tuning fork based probes, with gold nanoparticle tip
- Renishaw spectrometer and optics
STM: SPECS/Nanonics (vacuum only)
- Colibri sensor
- Feedback modes: STM, AM-AFM, FM-AFM
- Atomic resolution in both AFM and STM configurations
- Heat-cold sample stage
- Connected under vacuum to a NAP-XPS