Basic knowledge about the main techniques of characterization and analysis of materials by electron microscopy.
Understanding how a electron microscope works.
To know what are the possibilities and limits of the different techniques:
- The choice of the adequate characterization technique
- Interpretation of images and results of different nature: SEM, (S)TEM, HRTEM, diffraction, EDS, EBSD
- Solid base for a later use of an electron microscope.
- Principles of SEM et TEM, electron optics, aberrations, Components of an electron microscope.
- Interaction between radiation and matter.
- Elastic and inelastic Interaction, secondary emission, diffusion of electrons by a crystal, diffraction, Bragg condition, Ewald sphere, recall of crystallography.
- Contrast formation (probes, SE, BSE).
- Crystallographic analysis (EBSD).
- Instrumentation and complementary techniques: (ESEM, Cryo-SEM, STEM, FIB).
- Diffraction contrast in TEM (BF,DF).
- Diffraction techniques (SAED).
- Analyses of defects.
- HRTEM (contrast transfer function, defocus, resolution).
- X-ray spectroscopy (EDS, WDS).
« Novel » microscopies
- 3D Microscopy (tomography, reconstruction).
- Ion Microscopy (He).
Required prior knowledge:
- Solid state physics.
- Electron structure.
- Cristalline defects.
- Analysis of microstructures.
- Surface analysis.
- Semester project and master thesis.
- Electron microscopy: Advanced methods.
Type of teaching:
- Ex cathedra.
Form of examination: