MSE-637a/b Transmission Electron Microscopy and Diffraction

Offered each Spring and Fall semester. Students enrolled in this course  (1-credit) learn electron scattering theory, all practical approaches for imaging and spectroscopic analysis, while also covering the underlying physics, and literature reviews along with in-class discussions on TEM sample preparation and analysis strategies specific to each enrolled student’s research project. The course also features intensive demonstrations for learning all necessary steps for standard TEM operation.

Registration

This 1-credit doctoral school MSE-637 is held two times per year, once in the autumn semester (MSE-637a) and once in the spring semester (MSE-637b).

The next course will be given in Spring 2020.

Program and lecture notes will become available on Moodle.

Please register via IS-Academia. Post-docs should contact [email protected]

Objectives

1) To understand the basics of the transmission electron microscope and its imaging capabilities.
2) To understand electron diffraction.
3) To understand TEM image contrast, in particular for bright-field and dark-field imaging modes.
4) To understand the basics of image contrast in high-resolution TEM.
5) To assess TEM specimen preparation techniques for different materials (i.e. non-biological) samples.
6) To understand various application examples relevant to materials science, physics and chemistry.

Content

This intensive course is intended for researchers who are potential new users of transmission electron microscopes for study of materials (i.e. all non-biological) samples. It will provide them with a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and related theories of image formation.

Demonstrations will be given on the microscopes.

Basic knowledge of crystallography and diffraction is advised.