MSE-636 | Scanning Electron Microscopy Techniques

Offered each Fall and Spring semester, this 1-credit course covers the physical principles underlying SEM, various imaging techniques available in SEM, as well as practical approaches and demonstrations. Students are also introduced to energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD) and ion beam methods. This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications. Content This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical techniques EDS and EBSD, related theories of image formation.

Registration

The MSE-636 is held two times per year, once in the autumn semester (MSE-636a) and once in the spring semester (MSE-636b).

The next edition of the course will take place in November 2021,
8 – 10

The schedule and course material will be made available on Moodle. 

Please register via IS-Academia, or contact [email protected].

 

Objectives

1) To understand the basics of a scanning electron microscope and its capabilities.
2) To understand the image contrast formation in scanning electron microscopy (SE, BSE, low-kV, resolution).
3) To understand analytical techniques as X-Ray spectroscopy and Electron backscatter diffraction.
4) To understand image formation in environmental SEM.
5) To understand Ion beam techniques (FIB and He-Ion microscopy).
6) To assess the different possibilities and application domains (Materials sciences, biology, crystalline or amorphous materials…).

 

Content

This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical techniques EDS, related theories of image formation.

Demonstrations will be given on the microscopes.

 

 

Useful links

CASINO

Monte Carlo simulation of electron trajectory in solids