The scanning and analytical TEM doctoral school MSE-635 is held once per year in the spring semester. The next running of the course will be in the Spring 2020 semester.
30 April–2 May
Wednesday: 08h15-12h00 in DIA 004; 13h15-17h00 demos in CIME (MXC-010 / 012 / 030)
Thursday: 08h15-12h00 in DIA 005
To register for the course please contact your doctoral school program.
Exam date: TBA
Exam format: oral
1) To know the standard methods available for chemical analysis in a TEM.
2) To understand the image contrast formation in scanning transmission electron microscopy (BF, DF, HAADF).
3) To understand physical processes behind X-Ray analysis in a TEM.
4) To understand the physical processes behind Electron Energy Loss spectrometry in a TEM.
5) To assess applicability of each of the technique presented, depending on the problem to be solved.
6) To be able to understand a paper using one of those technique .
This intensive course is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.
Demonstrations will be given on the microscopes.
Required prior knowledge: Doctoral school MSE-637 Transmission Electron Microscopy and Diffraction or equivalent.
Program and lecture notes
Please download lecture notes before the lectures.
No printed material will be distributed
- MSE-635 STEM and AEM 2019 Program
- Chapter 1 STEM.pdf
- STEM_EDX 2019
- TEM Tomography 2019
- Chapter 4 Cs-TEM vs Cs-STEM.pdf
- Chapter 5 EELS-DS2019
- Chapter 6 HRTEM Sim 2018.pdf