MSE-735 | Scanning and Analytical Transmission Electron Microscopy

This intensive course is offered each Spring semester and discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.


This 1-credit Scanning and Analytical TEM doctoral school MSE-735 course is held every two years in the spring semester.

The next running of the course will take place in Summer 2025.

Program and lecture notes will become available on Moodle.

Please register via IS-Academia, or contact [email protected].


1) To know the standard methods available for chemical analysis in a TEM.
2) To understand the image contrast formation in scanning transmission electron microscopy (BF, DF, HAADF).
3) To understand physical processes behind X-Ray analysis in a TEM.
4) To understand the physical processes behind Electron Energy Loss spectrometry in a TEM.
5) To assess applicability of each of the technique presented, depending on the problem to be solved.
6) To be able to understand a paper using one of those technique .


This intensive course is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM (or equivalent) or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.

Demonstrations will be given on the microscopes.