MSE-635 Scanning and Analytical Transmission Electron Microscopy

The scanning and analytical TEM doctoral school MSE-635 is held once per year in the spring semester. The next running of the course will be in the Spring 2020 semester.

Spring 2019

30 April–2 May

1 credit

Tuesday: 10h15-12h00 in DIA 004, 13h15-17h00 in GCD 0386

Wednesday: 08h15-12h00 in DIA 004; 13h15-17h00 demos in CIME (MXC-010 / 012 / 030)

Thursday: 08h15-12h00 in DIA 005

To register for the course please contact your doctoral school program.

Exam date: TBA

Exam format: oral

Objectives:

1) To know the standard methods available for chemical analysis in a TEM.
2) To understand the image contrast formation in scanning transmission electron microscopy (BF, DF, HAADF).
3) To understand physical processes behind X-Ray analysis in a TEM.
4) To understand the physical processes behind Electron Energy Loss spectrometry in a TEM.
5) To assess applicability of each of the technique presented, depending on the problem to be solved.
6) To be able to understand a paper using one of those technique .

Content:

This intensive course is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.

Demonstrations will be given on the microscopes.

Required prior knowledge: Doctoral school MSE-637 Transmission Electron Microscopy and Diffraction or equivalent.

Program and lecture notes

Please download lecture notes before the lectures.

No printed material will be distributed