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Interdisciplinary Centre for Electron Microscopy
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Focused Ion Beam, 3D Microscopy
Focused Ion Beam, 3D Microscopy
Focused Ion Beam
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3D Microscopy
Interdisciplinary Centre for Electron Microscopy
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About CIME
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CIME microscopes
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Microscopes CIME Lausanne
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SEM Zeiss Gemini
SEM Zeiss Merlin
SEM Zeiss Merlin 3View
TEM Tecnai Osiris
TEM Talos F200S
TEM Titan Themis
TEM Talos L120C G2
TEM Tecnai F20 Cryo
TEM Tecnai Spirit
TEM JEOL 2200FS
FIB/SEM NVision
FIB/SEM CrossBeam
FIB/SEM Helios G4 PFIB UXe
CL SEM Attolight Rosa 4634
Microscopes CIME Valais
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Teneo SEM – LowVAC
Tecnai G2 Spirit Twin
Spectra200 S/TEM
Sample Preparation
News CIME
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CIME DAY 2023
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Introduction to EM
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SEM techniques
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CIME-Valais
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Training for materials science
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TEM Training
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Training for life sciences
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Teaching
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Bachelor-Master
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Introduction to microscopy + Laboratory work
Experimental methods in physics
Doctoral School
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MSE-636 | Scanning Electron Microscopy Techniques
MSE-637 | Transmission Electron Microscopy and Diffraction
MSE-735 | Scanning and Analytical Transmission Electron Microscopy
MSE-704 | 3D Electron Microscopy and FIB-Nanotomography
CH-633 | Advanced Solid State and Surface Characterization
CIME Workshop on STEM
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Research
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Projects
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Bonding with the Solid-Liquid Interdiffusion (SLID) process
Laser Welding CTI Project
Solid Oxide Fuel Cell
Focused Ion Beam, ultimate TEM specimen preparation
Superconductors for High magnetic fields
Focused Ion Beam, 3D Microscopy
Focused Ion Beam, cross-sectioning, micromachining
Angular resolved low loss EELS
NaPhoD nanohybrids for Photonic devices
Structure of the adult sensory neocortex
Photovoltaics and thin films
Publications
CIME Seminars
Image gallery
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Image of the moment – winners
Image of the moment – rules and image submission
Images for the contest 2021
Images for the contest 2022
Images for the contest 2023
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Other analytical resources and platforms at EPFL
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