Research activities at CIME
Research is a key function of the Electron Microscopy Centre enabling it to provide a wide range of the latest techniques to researchers at the EPFL.
To stay competent and open-minded to the users questions, CIME leads its own research and development activity in the following fields:
- Precision-Measurement of materials properties.
- Holography, DPC, 4D-STEM, Electromagnetic and strain fields measurements.
- Developing techniques for imaging 2D materials.
- 3D imaging and analysis with focused ion beam microscopy for Materials and Life Sciences.
- Computational electron microscopy with its ability to calculate high resolution images and diffraction patterns for quantitative interpretation of EM images.
- 3D reconstruction: Electron tomography and Single Particle Analysis
- Electron Diffraction techniques
- 2D and 3D imaging of crystal defects.
The CIME is also involved in a number of other research projects in which electron microscopy plays a key role.
CIME publications:
Book:
“Sample preparation guide for Transmission Electron Microscopy, Volume 1 & 2”
The first volume covers theoretical and practical aspects of sample preparation for TEM.
The second volume is dedicated to technical hints. It compiles 36 preparation detailed protocols for TEM analysis.
Transmission electron microscopy (TEM) analysis is an important step for studying the structure and chemistry of materials. Therefore, Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret and Danièle Laub created the internet website:
Sample preparation guide for Transmission Electron Microscopy
This website is dedicated to TEM sample preparation in the interdisciplinary field of Material Science, Earth Science and Biology. Designed in French and English, this website is accessible free of charge for the whole national and international electron microscopy community. This website contains « an interactive educative guide » composed of a data base including all kinds of materials, allowing automatically, to make the decision on the choice of the best TEM sample preparation technique with regard to the specific material properties and the type of analyses required. This website encompass 36 sample preparation techniques.
Recent articles
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– Computational electron microscopy with its ability to calculate high resolution images and diffraction patterns for quantitative interpretation of EM images.
– 3D imaging and analysis with focused ion beam microscopy for Materials and Life Sciences
– Cathodoluminescense in the scanning/transmission microscope with the new Jeol 2200FS currently being installed
– Electron energy loss spectrometry.