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Bachelor-Master

The Interdisciplinary Centre for Electron Microscopy (CIME) provides courses and practical works to Bachelor and Master Students of the Swiss Federal Institute of Technology in Lausanne.

Introduction to microscopy + Laboratory work

MSE-352

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Experimental methods in physics

PHYS-405

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Other (not CIME) course on electron microscopy:

Electron microscopy: advanced methods

MSE-450

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  • Interdisciplinary Centre for Electron Microscopy
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    • About CIME
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      • CIME team
      • Executive Committee
      • CIME microscopes
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        • Microscopes CIME Lausanne
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          • SEM Zeiss Gemini
          • SEM Zeiss Merlin
          • SEM Zeiss Merlin 3View
          • TEM Tecnai Osiris
          • TEM Talos F200S
          • TEM Titan Themis
          • TEM Talos L120C G2
          • TEM Tecnai F20 Cryo
          • TEM Tecnai Spirit
          • TEM JEOL 2200FS
          • FIB/SEM NVision
          • FIB/SEM CrossBeam
          • FIB/SEM Helios G4 PFIB UXe
          • CL SEM Attolight Rosa 4634
        • Microscopes CIME Valais
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          • Teneo SEM – LowVAC
          • Tecnai G2 Spirit Twin
          • Spectra200 S/TEM
      • Sample Preparation
      • News CIME
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        • CIME DAY 2023
      • History (fr)
      • Finding CIME
      • Introduction to EM
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        • SEM techniques
        • TEM techniques
        • FIB techniques
    • CIME-Valais
    • Service & Training
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      • Service
      • Hands-on training
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        • Training for materials science
        • Training for life sciences
      • Users fees
      • CIME rules
      • Industrial service
    • Teaching
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      • Bachelor-Master
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        • Introduction to microscopy + Laboratory work
        • Experimental methods in physics
      • Doctoral School
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        • MSE-636 | Scanning Electron Microscopy Techniques
        • MSE-637 | Transmission Electron Microscopy and Diffraction
        • MSE-735 | Scanning and Analytical Transmission Electron Microscopy
        • MSE-704 | 3D Electron Microscopy and FIB-Nanotomography
        • CH-633 | Advanced Solid State and Surface Characterization
      • CIME Workshop on STEM
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        • General information
        • Registration
        • Topics
        • Program
        • Lecturers
        • Flyer
    • Research
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      • Projects
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        • Bonding with the Solid-Liquid Interdiffusion (SLID) process
        • Laser Welding CTI Project
        • Solid Oxide Fuel Cell
        • Focused Ion Beam, ultimate TEM specimen preparation
        • Superconductors for High magnetic fields
        • Focused Ion Beam, 3D Microscopy
        • Focused Ion Beam, cross-sectioning, micromachining
        • Angular resolved low loss EELS
        • NaPhoD nanohybrids for Photonic devices
        • Structure of the adult sensory neocortex
        • Photovoltaics and thin films
      • Publications
      • CIME Seminars
    • Image gallery
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      • Image of the moment – winners
      • Image of the moment – rules and image submission
      • Images for the contest 2021
      • Images for the contest 2022
      • Images for the contest 2023
    • Useful links
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      • Other analytical resources and platforms at EPFL

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