FIB training

The FIB training is intended for students new to FIB who need one or more FIB techniques to investigate their samples. It is considered as an advanced training and a prior experience on SEM is required. If you do not have any previous SEM or FIB experience, you will go through both, SEM and FIB training.

At the conclusion of this training a student can independently operate one of SEM/FIB tools at CIME.

BSc course MSE-352 “Introduction to microscopy”

  • Offered each Fall semester. This introductory course in microscopy aims to give an overview of the different techniques for analyzing the microstructure and composition of materials, particularly those related to electron and optical microscopy. The course includes lectures as well as demonstrations.

MSc course PHYS-405 “Experimental methods in physics”

  • With this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data.

MSE-704 “3D Electron Microscopy and FIB-Nanotomography”

  • Offered each Spring semester. In this course the principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography. This course is intended for researchers who have a background in electron microscopy.

MSE-636 “Scanning Electron Microscopy techniques”

  • Offered each Fall and Spring semester, this 1-credit course covers the physical principles underlying SEM, various imaging techniques available in SEM, as well as practical approaches and demonstrations. Students are also introduced to energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD) and ion beam methods. This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications. Content This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical techniques EDS and EBSD, related theories of image formation.

CH-633 “Advanced solid-state characterisation techniques”

  • Offered every two years. This course aims at summarizing a multitude of state-of-the-art characterization methods for thin films, surfaces and nanomaterials. Applications of state-of-the-art techniques, both at EPFL facilities and outside, will be covered, providing theoretical bases, relevent topics and examples from current research. The course is aimed at applications in materials science/chemistry and chemical engineering. The course will consist of four modules, starting with a brief introduction to the physical, electronic and optical properties of the solid-state.

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