Offered every two years, this 2-credit course aims at summarizing a multitude of state-of-the-art characterization methods for thin films, surfaces and nanomaterials. The course consists covers selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).
The CH-633 course is held every two year in the spring semester. The next course will be given on Wednesdays in March – June 2021.
Program and lecture notes will become available on Moodle. Please register via IS-Academia.
By the end of the course, the student must be able to distinguish broad overview of state-of-the-art methods, choosing and designing method and experiment purposefully
The course will consist of four modules, starting with a brief introduction to the physical, electronic and optical properties of the solid-state, followed by lecturer on X-ray scattering, spectroscopy, Scanning probe microscopy (SPM), and electron microscopy.