Interdisciplinary Center for Electron Microscopy
Booking of Microscopes
You can use the CIME equipment according to your individual access rights. If you come on campus during the weekend make sure that you have an authorization from your lab director.
COVID-19
Welcome back at CIME, follow the new directives for your safety.
CIME Workshop on STEM
Postponed due to the pandemic
CIME Day 2020 6 March, Rolex Forum
best picture: Andrea Giunto
Nathan RIGUET Poster CIME2020 Final
best poster Materials Science: Fabien GEORGET, STI-IMX-LMC
Seminar announcement:
Seminar announcement: Friday 29th of November, MXC-315
eCHORD a method of mapping orientations with high resolution in SEM
Dr. Cyril Langlois, Laboratoire MATEIS INSA Lyon
The “Microscopies” team of the MATEIS laboratory (INSA Lyon) has developed a new method of mapping orientations and phases based on an electron-matter interaction that is starting to be exploited thanks to the improvement of the detectors and processing computers in the last decades. This is the electron channeling by the crystalline planes, a phenomenon that explains the contrast between the grains on an electron microscopy image. In this talk, the principle of using the channeling phenomenon to go back to the crystalline orientation (eCHORD approach) will be explained. The main advantages of the eCHORD technique are a better spatial resolution thanks to the low voltage (possible mappings down to 1 kilovolt instead of the usual 10kV in EBSD), and simplicity of use (simplified acquisition geometry, no additional detector in the microscope). The performances of the technique will be put forward, especially in comparison with the EBSD.
New online cours on transmission electron microscopy
Transmission Electron Microscopy for Materials Science new on Coursera: https://www.coursera.org/learn/microscopy
Built from the ground up, the course is intended to be a starting point for understanding and working with TEM; to be used either as a stand alone resource, or in complement to books and in person teaching or coaching. We hope that it proves useful to our electron microscopy community, and look forward to receiving any feedback.
With regards
Cécile Hébert and Duncan Alexander
EPFL-SB-IPHYS-LSME