Interdisciplinary Center for Electron Microscopy

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Independent of your rights in our booking system: Access to EPFL Campus and labs is only allowed from 7am to 10pm (7h00 – 22h00) at the moment.


Welcome back at CIME, follow the new directives for your safety.

CIME Workshop on STEM

Postponed due to the pandemic

CIME Day 2020 6 March, Rolex Forum

best picture: Andrea Giunto

best Life-Science: Nathan RIGUET, SV-LMNN
Nathan RIGUET Poster CIME2020 Final

best poster Materials Science: Fabien GEORGET, STI-IMX-LMC

Seminar announcement:

Seminar announcement: Friday 29th of November, MXC-315

eCHORD a method of mapping orientations with high resolution in SEM

Dr. Cyril Langlois, Laboratoire MATEIS INSA Lyon

The “Microscopies” team of the MATEIS laboratory (INSA Lyon) has developed a new method of mapping orientations and phases based on an electron-matter interaction that is starting to be exploited thanks to the improvement of the detectors and processing computers in the last decades. This is the electron channeling by the crystalline planes, a phenomenon that explains the contrast between the grains on an electron microscopy image. In this talk, the principle of using the channeling phenomenon to go back to the crystalline orientation (eCHORD approach) will be explained. The main advantages of the eCHORD technique are a better spatial resolution thanks to the low voltage (possible mappings down to 1 kilovolt instead of the usual 10kV in EBSD), and simplicity of use (simplified acquisition geometry, no additional detector in the microscope). The performances of the technique will be put forward, especially in comparison with the EBSD.

New online cours on transmission electron microscopy

Transmission Electron Microscopy for Materials Science new on Coursera:

Built from the ground up, the course is intended to be a starting point for understanding and working with TEM; to be used either as a stand alone resource, or in complement to books and in person teaching or coaching. We hope that it proves useful to our electron microscopy community, and look forward to receiving any feedback.

With regards

Cécile Hébert and Duncan Alexander


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