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2014. 13th International Conference on Nanoimprint and Nanoprint Technology (NNT 2014), Kyoto, Japan, October 22-24.A. Gopakumar; Z. Fei; E. Paunescu; V. Auzelyte; J. Brugger et al.
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2014. The 7th Asia-Pacific Conference on Transducers and Micro/Nano Technologies, Daegu, Korea, June 29- July 2, 2014. DOI : 10.11188/seisankenkyu.66.281.S. De Pedro; A. Voigt; V. J. Cadarso; J. Vila-Planas; J. Brugger et al.
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Biochimica et Biophysica Acta (BBA) – Molecular Cell Research. 2013. Vol. 1833, num. 12, p. 3415-3425. DOI : 10.1016/j.bbamcr.2013.10.012.R. Menchon-Enrich; A. Llobera; J. Vila-Planas; V. J. Cadarso; J. Mompart et al.
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2013. Vol. 306, p. 292-295. DOI : 10.1016/j.nimb.2012.12.064.W. Fang; M. Esashi; R. Ghodssi; J. Brugger
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2013. 39th International Conference on Micro and Nano Engineering (MNE 2013), London, 16-19 September 2013.V. J. Cadarso; S. Chosson; K. Sidler; R. D. Hersch; J. Brugger
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2010. 36th International Conference on Micro and Nano Engineering (MNE 2010), Genova, Italy, September 19-22, 2010.A. Macor; E. de Rijk; G. Boero; J-P. Ansermet; S. Alberti
2010. 35th Int. Conference on Infrared, Millemeter and Terahertz Waves (IRMMW-THz 2010), 2010. DOI : 10.1109/ICIMW.2010.5612362.V. J. Cadarso; K. Pfeiffer; U. Ostrzinski; J. B. Bureau; G. A. Racine et al.
Journal of Micromechanics and Microengineering. 2010. Vol. 21, num. 1, p. 017003. DOI : 10.1088/0960-1317/21/1/017003.T. Kiefer; G. Villanueva; F. Fargier; F. G. Favier; J. Brugger
Nanotechnology. 2010. Vol. 21, num. 50, p. 505501. DOI : 10.1088/0957-4484/21/50/505501.T. Braschler; A. Valero; L. Colella; K. Pataky; J. Brugger et al.
Lab on a Chip. 2010. Vol. 10, num. 20, p. 2771-2777. DOI : 10.1039/c004988c.T. Kiefer; G. Villanueva; F. Fargier; F. Favier; J. Brugger
Applied Physics Letters. 2010. Vol. 97, num. 12, p. 121911. DOI : 10.1063/1.3491263.E. Milyutin; S. Harada; D. Martin; J. F. Carlin; N. Grandjean et al.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 2010. Vol. 28, num. 6, p. L61. DOI : 10.1116/1.3501117.T. Kiefer; A. Salette; G. Villanueva; J. Brugger
Journal of Micromechanics and Microengineering. 2010. Vol. 20, p. 105019. DOI : 10.1088/0960-1317/20/10/105019.V. J. Cadarso; K. Pfeiffer; U. Ostrzinski; J-B. Bureau; G-A. Racine et al.
2010. 36th International Conference on Micro & Nano Engineering (MNE), Genoa, Italy, September 19-22, 2010.M. J. K. Klein; M. Guillaumée; B. Wenger; A. Dunbar; J. Brugger et al.
Nanotechnology. 2010. Vol. 21, num. 20, p. 205301. DOI : 10.1088/0957-4484/21/20/205301.G. Weber; N. Blondiaux; M. Giazzon; N. Matthey; M. J. K. Klein et al.
Langmuir. 2010. Vol. 26, num. 11, p. 8180-8186. DOI : 10.1021/la904526u.M. J. K. Klein; M. Guillaumée; A. Dunbar; R. Eckert; H. Heinzelmann et al.
2010. Micro and Nano Engineering (MNE) 2010, Genova, Italy, September 19-22, 2010.S. Brun; E. Guibert; A. V. Savu; O. Vazquez Mena; J. Brugger et al.
2010. Micro and Nano Engineering (MNE) 2010, Genova, Italy, September 19-22, 2010.A. V. Savu; D. Engstrom; X. Zhu; W. Milne; P. Boggild et al.
2010. M36th International Conference on Micro & Nano Engineering (MNE’2010), Genova, Italy, September 19-22, 2010.C. Ingrosso; C. Martin Olmos; A. Llobera; C. Innocenti; C. Sangregorio et al.
2010. MEMSWAVES 2010 and MEMS, Italy, 2010. p. 580-584.D. Tsamados; N. V. Cvetkovic; K. Sidler; J. Bhandari; V. Savu et al.
Solid-State Electronics. 2010. Vol. 54, num. 9, p. 1003-1009. DOI : 10.1016/j.sse.2010.04.019.K. Sidler; N. Cvetkovic; A. V. Savu; D. Tsamados; M. A. Ionescu et al.
Sensors and Actuators A. 2010. Vol. 162, num. 2, p. 155-159. DOI : 10.1016/j.sna.2010.04.016.V. Savu; M. J. K. Klein; F. Montagne; O. Vazquez-Mena; J. Brugger et al.
2010. EIPBN’2010. The 54th International Confrence on Electron, Ion, Photon Beam Technology and Nanofabrication., Anchorage, Alaska, U.S.A., June 1-4, 2010.V. Savu; S. Neuser; G. Villanueva; O. Vazquez-Mena; K. Sidler et al.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 2010. Vol. 28, num. 1, p. 169-172. DOI : 10.1116/1.3292630.V. J. Cadarso; K. Pfeiffer; U. Ostrizinski; A. Voigt; G. Gruetzner et al.
2010. EIPBN- The 54th International Confrence on Electron, Ion, Photon Beam Technology and Nanofabrication, Anchorage, Alaska, USA, June 1-4, 2010.T. Kiefer; A. Salette; L. G. Villanueva; J. Brugger
2010. 23rd International IEEE Conference on Micro Electro Mechanical Systems MEMS’2010, Hong Kong, 24-28 January, 2010. DOI : 10.1109/MEMSYS.2010.5442547.T. Kiefer; G. Villanueva; J. Brugger
Physical Review E. 2009. Vol. 80, num. 2, p. 021104. DOI : 10.1103/Physreve.80.021104.M. Sansa; J. Arcamone; J. Verd; A. Uranga; G. Abadal et al.
2009. Eurosensor XXIII conference, Lausanne, Switzerland, September 6-9, 2009. p. 425-428. DOI : 10.1016/j.proche.2009.07.106.C. Santschi; J. Przybylska; M. Guillaumee; O. Vazquez-Mena; J. Brugger et al.
Praktische Metallographie-Practical Metallography. 2009. Vol. 46, num. 3, p. 154-156.J. Anders; S. Reymond; G. Boero; K. Scheffler
2009. 13th International Conference on Biomedical Engineering (ICBME), Singapore, SINGAPORE, Dec 03-06, 2008. p. 89-93. DOI : 10.1007/978-3-540-92841-6_22.J. Anders; G. Chiaramonte; P. SanGiorgio; G. Boero
Journal Of Magnetic Resonance. 2009. Vol. 201, p. 239-249. DOI : 10.1016/j.jmr.2009.09.019.J. Y. Kim; V. Fakhfouri; K. Pfeiffer; A. Voigt; M. Fink et al.
2009. 25th International Conference on Digital Printing Technologies, Louisville, KY, Sep 20-24, 2009. p. 803-805.K. Pataky; M. Ackermann; T. Braschler; M. Lutolf; P. Renaud et al.
2009. 25th International Conference on Digital Printing Technologies, Louisville, KY, Sep 20-24, 2009. p. 411-414.G. Boero; S. Rusponi; P. Bencok; R. Meckenstock; J-U. Thiele et al.
Physical Review B. 2009. Vol. 79, num. 22, p. 224425. DOI : 10.1103/PhysRevB.79.224425.G. Boero; S. Rusponi; J. Kavich; A. L. Rizzini; C. Piamonteze et al.
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IEEE Transactions on Applied Superconductivity. 2009. Vol. 19, num. 3, p. 242-244. DOI : 10.1109/TASC.2009.2019075.J. Grisolia; B. Viallet; C. Amiens; S. Baster; A. Cordan et al.
Nanotechnology. 2009. Vol. 20, num. 35, p. 355303. DOI : 10.1088/0957-4484/20/35/355303.V. J. Cadarso; A. Llobera; G. Villanueva; J. A. Plaza; J. Brugger et al.
2009. XXIII Eurosensors Conference, Lausanne, Switzerland, September 6-9, 2009.. p. 560-563. DOI : 10.1016/j.proche.2009.07.140.K. Sidler; N. V. Cvetkovic; V. Savu; D. Tsamados; A. M. Ionescu et al.
2009. XXIII Eurosensors Conference, Lausanne, Switzerland, September 6-9, 2009.. DOI : 10.1016/j.proche.2009.07.190.K. Pataky; O. Vazquez-Mena; J. Brugger
2009. Nano-Net 2009, 4th International ICST Conference on Nano-Networks, Luzern, Switzerland, October 18-20, 2009..N. V. Cvetkovic; D. Tsamados; K. Sidler; J. Bhandari; V. Savu et al.
2009. 39th European Solid-State Device Research Conference (ESSDERC), Athens, Greece, September 14-18, 2009. p. 205-208. DOI : 10.1109/ESSDERC.2009.5331352.O. Vazquez-Mena; L. G. Villanueva; V. Savu; K. Sidler; P. Langlet et al.
Nanotechnology. 2009. Vol. 20, num. 41, p. 415303. DOI : 10.1088/0957-4484/20/41/415303.A. Bernabé; M. Lalanne; L. Presmanes; J. Soon; P. Tailhades et al.
2009. 2nd International Symposium on Transparent Conductive Oxides, Hersonissos, Crete, Greece, October 22 – 26 2008. p. 1044-1047. DOI : 10.1016/j.tsf.2009.03.232.K. Pataky; L. G. Villanueva; A. Liani; O. Zgheib; N. Jenkins et al.
Radiation Research. 2009. Vol. 172, num. 2, p. 252-259. DOI : 10.1667/RR1483.1.V. Savu; S. Neuser; L. G. Villanueva; O. Vazquez-Mena; K. Sidler et al.
2009. 53rd International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication, Marco Island, FL, USA, May 26-29, 2009. DOI : 10.1116/1.3292630.C. Ingrosso; J. Y. Kim; E. Binetti; V. Fakhfouri; M. Striccoli et al.
Microelectronic Engineering. 2009. Vol. 86, p. 1124-1126. DOI : 10.1016/j.mee.2008.11.028.C. Martin; A. Llobera; G. Villanueva; A. Voigt; G. Gruetzner et al.
Microelectronic Engineering. 2009. Vol. 86, num. 4-6, p. 1226-1229. DOI : 10.1016/j.mee.2008.12.033.J. Y. Kim; C. Ingrosso; V. Fakhfouri; M. Striccoli; A. Agostiano et al.
Small. 2009. Vol. 5, p. 1051-1057. DOI : 10.1002/smll.200801315.G. Villanueva; O. Vazquez-Mena; C. Hibert; J. Brugger
2009. MEMS 2009, Sorrento, Italy, January 25-29, 2009. DOI : 10.1109/MEMSYS.2009.4805339.O. Vazquez-Mena; T. Sannomiya; M. Tosun; J. Voros; G. Villanueva et al.
2009. 15th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers), Denver, USA, 2009. DOI : 10.1109/SENSOR.2009.5285463.K. Sidler; G. Villanueva; O. Vazquez-Mena; J. Brugger
2009. 15th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers), Denver, USA, 2009.. DOI : 10.1109/SENSOR.2009.5285768.V. Fakhfouri; G. Mermoud; J. Y. Kim; A. Martinoli; J. Brugger
Micro and Nanosystems. 2009. Vol. 1, num. 1, p. 63-67. DOI : 10.2174/1876402910901010063.J. Arcamone; M. Sansa; J. Verd; A. Uranga; G. Abadal et al.
Small. 2009. Vol. 5, p. 176-180. DOI : 10.1002/smll.200990007.O. Zgheib; K. Pataky; J. Brugger; T. D. Halazonetis
Molecular and Cellular Biology. 2009. Vol. 29, p. 1050-1058. DOI : 10.1128/MCB.01011-08.P. Weber; E. Guibert; S. Mikhailov; J. Brugger; G. Villanueva
2008. 20th International Conference on the Application of Accelerators in Research and Industry (CAARI), Fort Worth, USA, 2008. p. 539-541. DOI : 10.1063/1.3120093.G. Villanueva; J. A. Plaza; J. Montserrat; F. Perez-Murano; J. Bausells
Microelectronic Engineering. 2008. Vol. 85, num. 5-6, p. 1120-1123. DOI : 10.1016/j.mee.2008.01.082.D. Ramos; J. Tamayo; J. Mertens; M. Calleja; G. Villanueva et al.
Nanotechnology. 2008. Vol. 19, num. 3, p. 035503. DOI : 10.1088/0957-4484/19/03/035503.J. Arcamone; B. Misischi; F. Serra-Graells; M. A. F. van den Boogaart; J. Brugger et al.
Iet Circuits Devices & Systems. 2008. Vol. 2, p. 317-323. DOI : 10.1049/iet-cds:20070320.J. Grisolia; C. Dumas; G. Ben Assayag; C. Bonafos; S. Schamm et al.
2008. Meeting of the European-Materials-Research-Society, Strasbourg, FRANCE, May 28-Jun 01, 2007. p. 395-401. DOI : 10.1016/j.spmi.2007.12.013.C. Fournier; T. Kiefer; L. G. Villanueva; F. Fargier; J. Brugger et al.
2008. ECS Transactions, Hawaii, 2008. p. 457-463. DOI : 10.1149/1.2981151.N. V. Cvetkovic; D. Tsamados; K. Sidler; J. Brugger; A. M. Ionescu
2008. 26th International Conference on Microelectronics (MIEL 2008), Nis, Serbia, May 11-14, 2008. DOI : 10.1109/ICMEL.2008.4559282.C. Martin; C. Ingrosso; A. Llobera; F. Perez-Murano; C. Sangregorio et al.
2008. 34th International Conference on Micro and Nano Engineering (MNE’2008), Athens, Greece, September 15-18, 2008.G. Boero; S. Mouaziz; S. Rusponi; P. Bencok; F. Nolting et al.
New journal of physics. 2008. Vol. 10, p. 013011. DOI : 10.1088/1367-2630/10/1/013011.C. Dumas; J. Grisolia; J. Carrey; A. Arbouet; V. Paillard et al.
2008. European Materials Research Society (EMRS 2008): Symposium H: Materials and emerging technologies for non-volatile-memory devices, Strasbourg, France, June 26-30 2008..C. Dumas; L. Ressier; J. Grisolia; A. Arbouet; V. Paillard et al.
2008. European Materials Research Society (EMRS 2008): Symposium H: Materials and emerging technologies for non-volatile-memory devices, Strasbourg, France, June 26-30 2008..V. Savu; S. Neuser; J. Brugger
2008. 34th International Conference on Micro and Nano Engineering 2008 (MNE 2008), Athens, Greece, September 15-18, 2008..C. Martin; A. Llobera; G. Villanueva; A. Voigt; G. Gruetzner et al.
2008. 34th International Conference on Micro and Nano Engineering 2008 (MNE 2008), Athens, Greece, September 15-18, 2008. DOI : 10.1016/j.mee.2008.12.033.J. Y. KIM; V. Fakhfouri; C. Ingrosso; M. Striccoli; M. L. Curri et al.
2008. International Conference on Digital Fabrication Technologies, Pittsburgh, Pennsylvania, USA, September 7-12, 2008..C. Dumas; J. Grisolia; G. BenAssayag; C. Bonafos; S. Schamm et al.
2008. French Symposium on Emerging Technologies for Micro-nanofabrication, Toulouse, France, November 19-21, 2008.M. van den Boogaart; V. Savu; J. Brugger
2008. 52nd International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN 2008), Portland, Oregon, May 27–30, 2008.V. Savu; J. Brugger; J. Kivioja; J. Ahopelto
2008. Applied Superconductivity Conference 2008 (ASC 2008), Chicago, Illinois USA, August 17-22 2008. DOI : 10.1109/TASC.2009.2019075.M. Klein; M. Guillaumée; L. A. Dunbar; R. Eckert; H. Heinzelmann et al.
2008. 34th International Conference on Micro- and Nano Engineering 2008, Athens, Greece, Sept 15-18, 2008.K. W. Eberhardt; A. Hunkeler; U. Meier; J. Tharian; S. Mouaziz et al.
Physical Review B. 2008. Vol. 78, p. 214401 (5 pages). DOI : 10.1103/PhysRevB.78.214401.V. Savu; M. van den Boogaart; J. Brugger; J. Arcamone; M. Sansa et al.
Journal of Vacuum Science and Technology B. 2008. Vol. 26, p. 2054-2058. DOI : 10.1116/1.2987953.M. Lishchynska; M. van den Boogaart; V. Savu; J. Greer; J. Brugger
Microelectronic Engineering. 2008. Vol. 85, p. 2243-2249. DOI : 10.1016/j.mee.2008.07.009.R. Wiederkehr; M. Salvadori; J. Brugger; F. Degasperi; M. Cattani
Sensors and Actuators A. 2008. Vol. 144, p. 154-160. DOI : 10.1016/j.sna.2007.12.024.J. Y. Kim; D-G. Choi; J-H. Jeong; E-S. Lee
Applied Surface Science. 2008. Vol. 254, p. 4793-4796. DOI : 10.1016/j.apsusc.2008.01.095.S. Krishnamoorthy; Y. Gerbig; C. Hibert; R. Pugin; C. Hinderling et al.
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Advanced Materials. 2008. Vol. 20, num. 18, p. 3533-3538. DOI : 10.1002/adma.200702478.O. Vazquez Mena; G. Villanueva; V. Savu; K. Sidler; M. A. F. van den Boogaart et al.
Nano Letters. 2008. Vol. 8, num. 11, p. 3675-3682. DOI : 10.1021/nl801778t.B. Viallet; J. Grisolia; L. Ressier; M. Van Den Boogaart; J. Brugger et al.
Microelectronics Engineering. 2008. Vol. 85, num. 8, p. 1705-1708. DOI : 10.1016/j.mee.2008.04.027.O. Vazquez-Mena; G. Villanueva; M. A. F. van den Boogaart; V. Savu; J. Brugger
Microelectronic Engineering. 2008. Vol. 85, num. 5-6, p. 1237-1240. DOI : 10.1016/j.mee.2007.12.083.C. Martin; A. Llobera; T. Leïchlé; G. Villanueva; A. Voigt et al.
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2008. 33rd International Conference on Micro- and Nano Engineering 2007 (MNE 2007), Copenhagen, Denmark, 23-26 Sept, 2007. p. 1108-1111. DOI : 10.1016/j.mee.2007.12.069.G. Villanueva; O. Vazquez-Mena; M. A. F. van den Boogaart; K. Sidler; K. Pataky et al.
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Advanced Materials. 2008. Vol. 20, num. 10, p. 1962-1965. DOI : 10.1002/adma.200702005.S. Krishnamoorthy; R. Pugin; C. Hinderling; J. Brugger; H. Heinzelmann
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2008. 21st IEEE International Conference on Micro Electro Mechanical Systems 2008, Tucson, Arizona, USA, Jan 13-17, 2008. p. 407-410. DOI : 10.1109/MEMSYS.2008.4443679.T. Kiefer; F. Favier; O. Vazquez; G. Villanueva; J. Brugger
Nanotechnology. 2008. Vol. 19, num. 12, p. 125502. DOI : 10.1088/0957-4484/19/12/125502.O. Vazquez-Mena; V. Savu; K. Sidler; G. Villanueva; M. A. F. van den Boogaart et al.
2008. 3rd IEEE International Conference of Nano/Micro Engineered and Molecular Systems, Sanya, Hainan Island, China, January 6-9, 2008.. p. 807-811. DOI : 10.1109/NEMS.2008.4484447.G. Villanueva; O. Vazquez-Mena; M. A. F. van den Boogaart; K. Sidler; V. Savu et al.
2008. 33rd International Conference on Micro- and Nano Engineering 2007 (MNE 2007), 23-26 Sept, 2007, Copenhagen, Denmark, Copenhagen, Denmark, 23-26 Sept, 2007. p. 1010-1014. DOI : 10.1016/j.mee.2007.12.068.C. Martin; A. Llobera; T. Leïchlé; G. Villanueva; A. Voigt et al.
2008. 33rd International Conference on Micro- and Nano Engineering 2007 (MNE 2007), Copenhagen, Denmark, 23-26 Sept, 2007. p. 972-975. DOI : 10.1016/j.mee.2008.01.052.A. Perentes; G. Sinicco; G. Boero; B. Dwir; P. Hoffmann
2007. 51st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication, Denver, CO, May 29-Jun 01, 2007. p. 2228-2232. DOI : 10.1116/1.2794071.V. Savu; L. Frunzio; D. E. Prober
IEEE Transactions on Applied Superconductivity. 2007. Vol. 17, num. 2, p. 324-327. DOI : 10.1109/TASC.2007.898612.R. S. Wiederkehr; M. C. Salvadori; J. Brugger; F. T. Degasperi; M. Cattani
Smart Materials and Structures. 2007. Vol. 16, p. 2302-2307. DOI : 10.1088/0964-1726/16/6/033.K. W. Eberhardt; S. Mouaziz; G. Boero; J. Brugger; B. H. Meier
Physics Review Letters. 2007. Vol. 99, p. 227603. DOI : 10.1103/PhysRevLett.99.227603.K. Lee; M. Duchamp; G. Kulik; A. Magrez; J. W. Seo et al.
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physica status solidi (c). 2007. Vol. 4, num. 2, p. 276-278. DOI : 10.1002/pssc.200673344.M. Jenke; C. Schreiter; G. Kim; H. Vogel; J. Brugger
Microfluidics and Nanofluidics. 2007. Vol. 3, num. 2, p. 189-194. DOI : 10.1007/s10404-006-0119-2.J. Arcamone; A. Sanchez-Amores; J. Montserrat; M. van den Boogaart; J. Brugger et al.
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2007. 14th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers ’07), Lyon, France, June 10-14 , 2007. p. 1537-1540. DOI : 10.1109/SENSOR.2007.4300438.S. Mouaziz; C. Imboden; C. Santschi; O. Vazquez Mena; R. Popovic et al.
2007. 14th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers ’07), Lyon, France, June 10-14, 2007. p. 2589-2592. DOI : 10.1109/SENSOR.2007.4300701.O. Vazquez Mena; M. van den Boogaart; J. Brugger
2007. 14th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers ’07), Lyon, France, 10-14 June, 2007. p. 195-198. DOI : 10.1109/SENSOR.2007.4300104.C. Ingrosso; V. Fakhfouri; M. Striccoli; A. Agostiano; A. Voigt et al.
Advanced Functional Materials. 2007. Vol. 17, p. 2009-2017. DOI : 10.1002/adfm.200700098.J. Arcamone; B. Misischi; F. Serra-Graells; M. A. F. van den Boogaart; J. Brugger et al.
IEEE Transactions on Circuits and Systems II. 2007. Vol. 54, num. 5, p. 377-381. DOI : 10.1109/TCSII.2007.892228.G. Mermoud; V. Fakhfouri; A. Martinoli; J. Brugger
2007. 4th Annual Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices (FNANO07), Utah, USA, 18-21 April, 2007.H. Guo; D. Martrou; T. Zambelli; J. Polesel-Maris; A. Piednoir et al.
Virtual Journal of Nanoscale Science & Technology. 2007. Vol. 15, num. 10.H. Guo; D. Martrou; T. Zambelli; J. Polesel-Maris; A. Piednoir et al.
Applied Physics Letters. 2007. Vol. 90, num. 9, p. 093113. DOI : 10.1063/1.2710473.C. W. Park; O. Vazquez Mena; J. Brugger
Nanotechnology. 2007. Vol. 18, num. 4, p. 044002. DOI : 10.1088/0957-4484/18/4/044002.K. Ehrmann; K. Pataky; M. Stettler; F. M. Wurm; J. Brugger et al.
Lab on a Chip. 2007. Vol. 7, num. 3, p. 381-383. DOI : 10.1039/B613240E.C. Dumas; J. Grisolia; L. Ressier; A. Arbouet; V. Paillard et al.
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Microelectronic Engineering. 2007. Vol. 81, num. 1, p. 42-53. DOI : 10.1016/j.mee.2006.08.003.S. Mouaziz; G. Boero; R. S. Popovic; J. Brugger
IEEE Journal of Microelectromechanical Systems. 2006. Vol. 15, num. 4, p. 890-895. DOI : 10.1109/JMEMS.2006.879376.C. Danelon; M. Jenke; C. Schreiter; G. Kim; J-B. Perez et al.
Chimia. 2006. Vol. 60, num. 11, p. 754-760. DOI : 10.2533/chimia.2006.754.C. Danelon; C. Santschi; J. Brugger; H. Vogel
Langmuir. 2006. Vol. 22, num. 25, p. 10711-10715. DOI : 10.1021/la061321c.J. Arcamone; M. van den Boogaart; F. Serra-Graells; S. Hansen; J. Brugger et al.
2006. 2006 IEEE international Electron Devices, Electron Devices Meeting, Electron Devices Meeting, 2006. IEDM ’06. International, December 11-13, San Francisco, U.S.A., December 11-13, 2006. p. 1-4. DOI : 10.1109/IEDM.2006.346830.V. Fakhfouri; S. Jiguet; J. Brugger
Advances in Science and Technology. 2006. Vol. 45, p. 1293-1298. DOI : 10.4028/www.scientific.net/AST.45.1293.V. Fakhfouri; S. Jiguet; J. Brugger
2006. CIMTEC 2006 (11th International Conferences on Modern Materials and Technologies), Sicily, Italy, 4-9 June, 2006. p. 1293-1298.M. A. F. van den Boogaart; L. M. Doeswijk; J. Brugger
IEEE Journal of Microelectromechanical Systems. 2006. Vol. 15, num. 6, p. 1663-1670. DOI : 10.1109/JMEMS.2006.885981.C. W. Park; O. Vazquez Mena; M. A. F. van den Boogaart; J. Brugger
Journal of Vacuum Science and Technology B. 2006. Vol. 24, num. 6, p. 2772-2775. DOI : 10.1116/1.2366610.A. Arbouet; M. Carrada; F. Demangeot; V. Paillard; G. BenAssayag et al.
Journal of Luminescence. 2006. Vol. 121, num. 2, p. 340-343. DOI : 10.1016/j.jlumin.2006.08.070.A. Fraile Rodriguez; L. J. Heyderman; F. Nolting; A. Hoffmann; J. E. Pearson et al.
Applied Physics Letters. 2006. Vol. 89, num. 14, p. 142508. DOI : 10.1063/1.2357007.S. Krishnamoorthy; R. Pugin; J. Brugger; H. Heinzelmann; C. Hinderling
Advanced Functional Materials. 2006. Vol. 16, num. 11, p. 1469-1475. DOI : 10.1002/adfm.200500524.E. A. Speets; P. te Riele; M. A. F. van den Boogaart; L. M. Doeswijk; B. J. Ravoo et al.
Advanced Functional Materials. 2006. Vol. 16, num. 10, p. 1337-1342. DOI : 10.1002/adfm.200500933.M. A. F. van den Boogaart; M. Lishchynska; L. M. Doeswijk; J. C. Greer; J. Brugger
Sensors and Actuators A. 2006. Vol. 130-131, p. 568-574. DOI : 10.1016/j.sna.2005.08.037.N. Takano; L. M. Doeswijk; M. A. F. van den Boogaart; J. Auerswald; H. F. Knapp et al.
Journal of Micromechanics and Microengineering. 2006. Vol. 16, num. 8, p. 1606-1613. DOI : 10.1088/0960-1317/16/8/023.J. Steen; V. Blech; J. Brugger; B. J. Kim
2006. 2006 International Conference on Microtechnologies in Medicine and Biology, Okinawa, Japan, 9-12 May, 2006.N. Takano; L. M. Doeswijk; M. A. F. van den Boogaart; J. Brugger
2006. 2006 International Conference on Microtechnologies in Medicine and Biology, Okinawa, Japan, 9-12 May, 2006.J. Steen; T. Harada; M. Ishii; J. Brugger
2006. The 8th Korean MEMS Conference, Jeju, Korea, 6-8 April, 2006.C. Santschi; M. Jenke; P. Hoffmann; J. Brugger
Nanotechnology. 2006. Vol. 17, num. 11, p. 2722-2729. DOI : 10.1088/0957-4484/17/11/002.S. Mouaziz; G. Boero; G. Moresi; C. Degen; Q. Lin et al.
Microelectronic Engineering. 2006. Vol. 83, num. 4-9, p. 1306-1308. DOI : 10.1016/j.mee.2006.01.218.S. Krishnamoorthy; R. Pugin; J. Brugger; H. Heinzelmann; A. C. Hoogerwerf et al.
Langmuir. 2006. Vol. 22, num. 8, p. 3450-3452. DOI : 10.1021/la052299a.J. A. J. Steen; J. Hayakawa; T. Harada; K. Lee; F. Calame et al.
Nanotechnology. 2006. Vol. 17, num. 5, p. 1464-1469. DOI : 10.1088/0957-4484/17/5/050.C. Danelon; J-B. Perez; C. Santschi; J. Brugger; H. Vogel
Langmuir. 2006. Vol. 22, num. 1, p. 22-25. DOI : 10.1021/la052387v.G. Boero; S. Rusponi; P. Bencok; R. S. Popovic; H. Brune et al.
Applied Physics Letters. 2005. Vol. 87, num. 15, p. 1-3. DOI : 10.1063/1.2089180.V. A. Savu; C. M. Wilson; L. Fruzio; D. E. Prober; R. J. Schoelkopf
IEEE Transactions on Applied Superconductivity. 2005. Vol. 15, num. 2, p. 609-612. DOI : 10.1109/TASC.2005.849956.S. Keller; S. Mouaziz; G. Boero; J. Brugger
Virtual Journal of Nanoscale Science & Technology. 2005. Vol. 12, num. 26.S. Keller; S. Mouaziz; G. Boero; J. Brugger
Review of Scientific Instruments. 2005. Vol. 76, num. 12, p. 125102 (4 pages). DOI : 10.1063/1.2140443.G. Boero; I. Utke; T. Bret; N. Quack; M. Todorova et al.
Virtual Journal of Nanoscale Science & Technology. 2005. Vol. 86, p. 042503.M. Hopcroft; T. Kramer; G. Kim; K. Takashima; Y. Higo et al.
Fatigue and Fracture of Engineering Materials and Structures. 2005. Vol. 28, num. 8, p. 735-742. DOI : 10.1111/j.1460-2695.2005.00873.x.C. Cojocaru; C. Harnagea; F. Rosei; A. Pignolet; M. van den Boogaart et al.
Applied Physics Letters. 2005. Vol. 86, num. 18, p. 183107 (3 pages). DOI : 10.1063/1.1923764.G. Boero; I. Utke; T. Bret; N. Quack; M. Todorova et al.
Applied Physics Letters. 2005. Vol. 86, num. 4, p. 042503 (3 pages). DOI : 10.1063/1.1856134.A. Ludwig; J. Cao; J. Brugger; I. Takeuchi
Measurement Science and Technology. 2005. Vol. 16, num. 1, p. 111-118. DOI : 10.1088/0957-0233/16/1/015.T. M. Ito; T. Averett; D. Barkhuff; G. Batigne; D. H. Beck et al.
Physical Review Letters. 2004. Vol. 92, num. 10, p. 102003. DOI : 10.1103/PhysRevLett.92.102003.A. Kis; G. Csanyi; J. P. Salvetat; T. N. Lee; E. Couteau et al.
Nature Materials. 2004. Vol. 3, num. 3, p. 153-157. DOI : 10.1038/nmat1076.V. Savu; L. Li; A. Mukherjee; C. M. Wilson; L. Frunzio et al.
Nuclear Instruments and Methods in Physics Research A. 2004. Vol. 520, num. 1-3, p. 237-239. DOI : 10.1016/j.nima.2003.11.332.J. Hayakawa; K. Ito; M. Fujimori; S. Heike; T. Hashizume et al.
Journal of Applied Physics. 2004. Vol. 96, num. 6, p. 3440-3442. DOI : 10.1063/1.1769605.M. A. F. van den Boogaart; G. M. Kim; R. Pellens; J. P. van den Heuvel; J. Brugger
Virtual Journal of Biological Physics Research. 2004. Vol. 8, num. 12.A. Meister; M. Liley; J. Brugger; R. Pugin; H. Heinzelmann
Applied Physics Letters. 2004. Vol. 85, num. 25, p. 6260-6262. DOI : 10.1063/1.1842352.F. Vroegindeweij; E. Speets; J. Steen; J. Brugger; D. Blank
Applied Physics A – Mater. Sci. Process.. 2004. Vol. 79, num. 4-6, p. 743-745. DOI : 10.1007/s00339-004-2749-0.G. Kim; S. Kawai; M. Nagashio; H. Kawakatsu; J. Brugger
Journal of Vacuum Science and Technology B. 2004. Vol. 22, num. 4, p. 1658-1661. DOI : 10.1116/1.1761240.M. van den Boogaart; G. Kim; R. Pellens; J. van den Heuvel; J. Brugger
Journal of Vacuum Science and Technology B. 2004. Vol. 22, num. 6, p. 3174-3177. DOI : 10.1116/1.1802931.G. Boero; M. Demierre; P. Besse; R. Popovic
SENSORS AND ACTUATORS A-PHYSICAL. 2003. Vol. 106, num. 1-3, p. 314-320. DOI : 10.1016/S0924-4247(03)00192-4.G. Boero; M. Bouterfas; C. Massin; F. Vincent; P. Besse et al.
Review of Scientific Instruments. 2003. Vol. 74, num. 11, p. 4794-4798. DOI : 10.1063/1.1621064.C. Massin; F. Vincent; A. Homsy; K. Ehrmann; G. Boero et al.
Journal of Magnetic Resonance. 2003. Vol. 164, num. 2, p. 242-255. DOI : 10.1016/S1090-7807(03)00151-4.R. W. Tjerkstra; P. Ekkels; G. Krijnen; S. Egger; E. Berenschot et al.
2003. 12th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers’2003), Boston, USA, 8-12 June, 2003. p. 1651-1654. DOI : 10.1109/SENSOR.2003.1217099.G. M. Kim; M. A. F. van den Boogaart; S. Kawai; H. Kawakatsu; J. Brugger
2003. 12th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers ’03), Boston, USA, 8-12 June, 2003. p. 883-886. DOI : 10.1109/SENSOR.2003.1215616.M. Hopcroft; T. Kramer; G. M. Kim; K. Takashima; Y. Higo et al.
2003. International Conference on Advanced Technology in Experimental Mechanics 2003 (ATEM’03), Nagoya, Japan, 10-12 Sep, 2003.F. Vroegindeweij; J. Steen; J. Brugger; D. H. A. Blank
2003. 7th International Conference on Laser Ablation, Hersonissos, Crete, Greece, 5-10 Oct, 2003.J. Brugger; J. Gobrecht; H. Rothuizen; U. Staufer; P. Vettiger
2003.N. R. Tas; P. Mela; T. Kramer; J. W. Berenschot; A. van den Berg
Nano Letters. 2003. Vol. 3, num. 11, p. 1537-1540. DOI : 10.1021/nl034676e.M. Koelbel; R. W. Tjerkstra; G. M. Kim; J. Brugger; C. J. M. van Rijn et al.
Advanced Functional Materials. 2003. Vol. 13, num. 3, p. 219-224. DOI : 10.1002/adfm.200390033.G. M. Kim; B. J. Kim; J. Brugger
Sensors and Actuators A. 2003. Vol. 107, num. 2, p. 132-136. DOI : 10.1016/S0924-4247(03)00298-X.G. Kim; M. van den Boogaart; J. Brugger
Microelectronic Engineering. 2003. Vol. 67-68, p. 609-614. DOI : 10.1016/S0167-9317(03)00121-7.P. Ekkels; R. Tjerkstra; G. Krijnen; J. Berenschot; J. Brugger et al.
Microelectronic Engineering. 2003. Vol. 67-8, p. 422-429. DOI : 10.1016/S0167-9317(03)00098-4.G. Kim; B. Kim; E. Ten Have; F. Segerink; N. Van Hulst et al.
Journal of Microscopy. 2003. Vol. 209, num. 3, p. 267-271. DOI : 10.1046/j.1365-2818.2003.01134.x.P-A. Besse; G. Boero; M. Demierre; V. Pott; R. Popovic
Applied Physics Letters. 2002. Vol. 80, num. 22, p. 4199-4201. DOI : 10.1063/1.1483909.C. Massin; G. Boero; F. Vincent; J. Abenhaim; P-A. Besse et al.
Sensors and Actuators, A: Physical. 2002. Vol. 97-98, p. 280-288. DOI : 10.1016/S0924-4247(01)00847-0.G. M. Kim; B. J. Kim; J. Holleman; J. Huskens; E. ten Have et al.
2002. 3rd Korea-Switzerland Joint Symposium in MEMS and Nano-technologies, Jeju, Korea, 19-20 June, 2002.G. M. Kim; B. J. Kim; M. Liebau; J. Huskens; D. N. Reinhoudt et al.
IEEE Journal of Microelectromechanical Systems. 2002. Vol. 11, num. 3, p. 175-181. DOI : 10.1109/JMEMS.2002.1007395.V. Bucher; J. Brugger; D. Kern; G. M. Kim; M. Schubert et al.
Microelectronic Engineering. 2002. Vol. 61–62, p. 971-980. DOI : 10.1016/S0167-9317(02)00422-7.M. Kolbel; R. Tjerkstra; J. Brugger; C. van Rijn; W. Nijdam et al.
Nano Letters. 2002. Vol. 2, num. 12, p. 1339-1343. DOI : 10.1021/nl025784o.G. Kim; A. Kovalgin; J. Holleman; J. Brugger
Journal of Nanoscience and Nanotechnology. 2002. Vol. 2, num. 1, p. 55-59. DOI : 10.1166/jnn.2002.073.G. Boero; J. Frounchi; B. Furrer; P. Besse; R. Popovic
Review of Scientific Instruments. 2001. Vol. 72, num. 6, p. 2764-2768. DOI : 10.1063/1.1374599.G. Boero; P. Besse; R. Popovic
Applied Physics Letters. 2001. Vol. 79, num. 10, p. 1498-1500. DOI : 10.1063/1.1399306.S. P. Wells; T. Averett; D. Barkhuff; D. H. Beck; E. J. Beise et al.
PHYSICAL REVIEW C. 2001. Vol. 63, num. 6, p. 064001. DOI : 10.1103/PhysRevC.63.064001.G. M. Kim; B. J. Kim; J. Brugger
2001. 11th International Conference on Solid-State Sensors and Actuators (Transducers ’01) and Eurosensors XV, Munich, Germany, 10-14 June, 2001. p. 1632-1635. DOI : 10.1007/978-3-642-59497-7_379.B. J. Kim; G. M. Kim; M. Liebau; J. Huskens; D. N. Reinhoudt et al.
2001. IEEE International Workshop on MEMS 2001, Interlaken, Switzerland, 21-25 Jan, 2001. p. 106-109. DOI : 10.1109/MEMSYS.2001.906490.C. Rusu; R. van’t Oever; M. de Boer; H. Jansen; E. Berenschot et al.
IEEE Journal of Microelectromechanical Systems. 2001. Vol. 10, num. 2, p. 238-246. DOI : 10.1109/84.925758.B. J. Kim; M. Liebau; J. Huskens; D. N. Reinhoudt; J. Brugger
Microelectronic Engineering. 2001. Vol. 57-58, p. 755-760. DOI : 10.1016/S0167-9317(01)00469-5.B. J. Kim; J. W. Flamma; E. S. ten Have; M. F. Garcia-Parajo; N. F. van Hulst et al.
Journal of Microscopy. 2001. Vol. 202, num. 1, p. 16-21. DOI : 10.1046/j.1365-2818.2001.00820.x.P. Besse; C. Schott; G. Boero; F. Borger; R. Popovic
Measurement and Control. 2000. Vol. 33, num. 9, p. 261-264. DOI : 10.1177/002029400003300902.D. T. Spayde; T. Averett; D. Barkhuff; D. H. Beck; E. J. Beise et al.
Physical Review Letters. 2000. Vol. 84, num. 6, p. 1106-1109. DOI : 10.1103/PhysRevLett.84.1106.R. Hasty; A. M. Hawthorne-Allen; T. Averett; D. Barkhuff; D. H. Beck et al.
SCIENCE. 2000. Vol. 290, num. 5499, p. 2117-2119. DOI : 10.1126/science.290.5499.2117.G. Boero; C. de Raad Iseli; P. Besse; R. Popovic
SENSORS AND ACTUATORS A-PHYSICAL. 1998. Vol. 67, num. 1-3, p. 18-23. DOI : 10.1016/S0924-4247(97)01722-6.D. Allspach; A. Hahn; C. Kendziora; S. Pordes; G. Boero et al.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1998. Vol. 410, num. 2, p. 195-205. DOI : 10.1016/S0168-9002(98)00236-8.M. Willemin; C. Rossel; J. Brugger; M. Despont; H. Rothuizen et al.
Journal of Applied Physics. 1998. Vol. 83, num. 3, p. 1163. DOI : 10.1063/1.366811.H. Lorenz; M. Despont; N. Fahrni; J. Brugger; P. Vettiger et al.
Sensors and Actuators A: physical. 1998. Vol. 64, num. 1, p. 33-39. DOI : 10.1016/S0924-4247(98)80055-1.H. P. Lang; R. Berger; A. Andreoli; J. Brugger; M. Despont et al.
Applied Physics Letters. 1998. Vol. 72, num. (3), p. 383-385. DOI : 10.1063/1.120749.H. P. Lang; R. Berger; F. Battiston; J. P. Ramseyer; E. Meyer et al.
Appl. Phys. A. 1998. Vol. 66, num. 7, p. S61-S64. DOI : 10.1007/s003390051100.J. Brugger; G. Beljakovic; M. Despont; H. Biebuyck; N. F. de Rooij et al.
Sensors and Actuators A. 1998. Vol. 70, num. 1-2, p. 191-194. DOI : 10.1016/S0924-4247(98)00132-0.T. Akiyama; A. Tonin; H. Hidber; J. Brugger; P. Vettiger et al.
Sensors and Actuators A. 1998. Vol. 64, num. 1, p. 1-6. DOI : 10.1016/S0924-4247(98)80051-4.G. Baur; G. Boero; S. Brauksiepe; A. Buzzo; W. Eyrich et al.
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1997. Vol. 391, num. 1, p. 201-204. DOI : 10.1016/S0168-9002(96)01197-7.G. Boero; W. Kubischta; P. Leprince
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1997. Vol. 398, num. 2-3, p. 157-161. DOI : 10.1016/S0168-9002(97)00823-1.W. Oelert; G. Baur; G. Boero; S. Brauksiepe; A. Buzzo et al.
Hyperfine Interactions. 1997. Vol. 109, num. 1-4, p. 191-203. DOI : 10.1023/A:1012609601849.J. Brugger; G. Beljakovic; M. Despont; N. F. de Rooij; P. Vettiger
Microeleetronic Engineering. 1997. Vol. 35, p. 401-404. DOI : 10.1016/S0167-9317(96)00210-9.G. Baur; G. Boero; A. Brauksiepe; A. Buzzo; W. Eyrich et al.
Physics Letters B. 1996. Vol. 368, num. 3, p. 251-258. DOI : 10.1016/0370-2693(96)00005-6.G. Boero; M. Lovetere; M. Macrí; S. Passaggio; A. Pozzo
Nuovo Cimento della Societa Italiana di Fisica A. 1996. Vol. 109, num. 11, p. 1581-1590. DOI : 10.1007/BF02778241.N. Blanc; J. Brugger; N. F. de Rooij; U. Duerig
Journal of Vacuum Science & Technology B. 1996. Vol. 14, num. 2, p. 901-905. DOI : 10.1116/1.589171.P-F. Indermühle; V. P. Jaecklin; J. Brugger; C. Linder; N. F. de Rooij et al.
Sensors and Actuators A. 1995. Vol. 46-47, p. 562-565. DOI : 10.1016/0924-4247(94)00962-H.V. P. Jaecklin; C. Linder; J. Brugger; N. F. de Rooij; J. M. Moret et al.
Sensors and Actuators A. 1994. Vol. 43, num. 1-3, p. 296-274. DOI : 10.1016/0924-4247(93)00699-5.P. F. Indermuehle; C. Linder; J. Brugger; V. P. Jaecklin; N. F. de Rooij
Sensors and Actuators A. 1994. Vol. 43, num. 1-3, p. 346-350. DOI : 10.1016/0924-4247(93)00704-8.J. Brugger; N. Blanc; P. Renaud; N. F. de Rooij
Sensors and Actuators A. 1994. Vol. 43, num. 1-3, p. 339-345. DOI : 10.1016/0924-4247(93)00701-5.J. Brugger; V. P. Jaecklin; C. Linder; N. Blanc; P. F. Indermühle et al.
Journal of Micromechanics and Microengineering. 1993. Vol. 3, num. 4, p. 161-167. DOI : 10.1088/0960-1317/3/4/001.R. A. Buser; J. Brugger; N. F. de Rooij
Ultramicroscopy. 1992. Vol. 42-44, p. 1476-1480. DOI : 10.1016/0304-3991(92)90469-Z.J. Brugger; R. A. Buser; N. F. de Rooij
Sensors and Actuators A. 1992. Vol. 34, num. 3, p. 193-200. DOI : 10.1016/0924-4247(92)85002-J.J. Brugger; R. A. Buser; N. F. de Rooij
Journal of Micromechanics and Microengineering. 1992. Vol. 2, p. 218-220. DOI : 10.1088/0960-1317/2/3/026.R. Buser; J. Brugger; N. de Rooij
Microelectronic Engineering. 1991. Vol. 15, num. 1-4, p. 407-410. DOI : 10.1016/0167-9317(91)90252-9.