R. Farsi; N. Sahin Solmaz; M. Maury; G. Boero
Analytical Chemistry. 2024. DOI : 10.1021/acs.analchem.4c02769.D. A. Sandoval Salaiza; N. D. Valsangiacomo; N. U. Dinç; M. Yildirim; P. D. Dalton et al.
Polymers. 2024. Vol. 16, num. 12. DOI : 10.3390/polym16121630.P. C. Hall; H. W. Reid; I. Liashenko; B. Tandon; K. L. O’Neill et al.
Small. 2024. DOI : 10.1002/smll.202400882.M. M. Kiaee; T. Maeder; J. Brugger
Acs Sensors. 2024. Vol. 9, num. 3, p. 1382 – 1390. DOI : 10.1021/acssensors.3c02406.F. Girard; C. Lajoye; M. Camman; N. Tissot; F. B. Pedurand et al.
Advanced Functional Materials. 2024. DOI : 10.1002/adfm.202314757.L. Hageluken; M. G. Makowska; F. Marone; J. Brugger
Materialia. 2024. Vol. 33, p. 102025. DOI : 10.1016/j.mtla.2024.102025.L. Marti; N. S. Solmaz; M. Kern; A. Chu; R. Farsi et al.
Journal Of Magnetic Resonance Open. 2023. Vol. 18, p. 100145. DOI : 10.1016/j.jmro.2023.100145.B. Tandon; A. B. Zuege; S. Luposchainsky; P. D. Dalton
Advanced Engineering Materials. 2023. DOI : 10.1002/adem.202300335.J. Park; A. Bertsch; C. Martin Olmos; J. Brugger
Advanced Functional Materials. 2023. num. 2302385. DOI : 10.1002/adfm.202302385.A. Reizabal; T. Kangur; P. G. Saiz; S. Menke; C. Moser et al.
Additive Manufacturing. 2023. Vol. 71, p. 103604. DOI : 10.1016/j.addma.2023.103604.E. Zanchetta; G. Della Giustina; A. Gandin; V. Auzelyte; G. Brusatin
Journal Of Sol-Gel Science And Technology. 2023. Vol. 107, p. 122 – 132. DOI : 10.1007/s10971-021-05633-8.Y-C. Sun; G. Boero; J. Brugger
Advanced Materials Technologies. 2022. DOI : 10.1002/admt.202201119.P. Clement; J. Ackermann; N. Sahin-Solmaz; S. Herbertz; G. Boero et al.
Biosensors & Bioelectronics. 2022. Vol. 216, p. 114642. DOI : 10.1016/j.bios.2022.114642.A. Conde-Rubio; X. Liu; G. Boero; J. Brugger
Acs Applied Materials & Interfaces. 2022. Vol. 14, num. 37, p. 42328 – 42336. DOI : 10.1021/acsami.2c10150.Y. Wang; G. Boero; X. Zhang; J. Brugger
Acs Applied Materials & Interfaces. 2022. Vol. 14, num. 35, p. 40418 – 40426. DOI : 10.1021/acsami.2c10603.W. Xu; X. Li; J. Brugger; X. Liu
Nano Energy. 2022. Vol. 98, p. 107166. DOI : 10.1016/j.nanoen.2022.107166.J. Jang; G. Panusa; G. Boero; J. Brugger
Microsystems & Nanoengineering. 2022. Vol. 8, num. 1, p. 22. DOI : 10.1038/s41378-022-00351-9.H. Yu; A. Conde Rubio; H-C. Wang; O. Martin; G. Boero et al.
Particle & Particle Systems Characterization. 2022. p. 1 – 8, 2100288. DOI : 10.1002/ppsc.202100288.G. Sivelli; G. M. Conley; C. Herrera; K. Marable; K. J. Rodriguez et al.
Journal Of Magnetic Resonance. 2022. Vol. 335, p. 107142. DOI : 10.1016/j.jmr.2021.107142.M. Kollep; G. Konstantinou; J. Madrid-Wolff; A. Boniface; L. Hagelüken et al.
Advanced Engineering Materials. 2022. Vol. 24, num. 7, p. 2101345. DOI : 10.1002/adem.202101345.M. Groeb; L. Hagelüken; J. Groeb; W. Ensinger
Materials. 2022. Vol. 15, num. 7, p. 2409. DOI : 10.3390/ma15072409.L. Hagelüken; P. V. Warriam Sasikumar; H-Y. Lee; D. Di Stadio; Y. Chandorkar et al.
Journal of the European Ceramic Society. 2021. Vol. 42, num. 5, p. 1963 – 1970. DOI : 10.1016/j.jeurceramsoc.2021.12.044.Y-C. Sun; G. Boero; J. Brugger
ACS Applied Electronic Materials. 2021. Vol. 3, num. 12, p. 5423 – 5432. DOI : 10.1021/acsaelm.1c00884.J. Carthew; H. H. Abdelmaksoud; K. J. Cowley; M. Hodgson-Garms; R. Elnathan et al.
Advanced Functional Materials. 2021. p. 2100881. DOI : 10.1002/adfm.202100881.J. Carthew; H. H. Abdelmaksoud; M. Hodgson-Garms; S. Aslanoglou; S. Ghavamian et al.
Advanced Science. 2021. Vol. 8, num. 6, p. 2003186. DOI : 10.1002/advs.202003186.M. Kiaee; T. Maeder; J. Brugger
Advanced Materials Technologies. 2020. p. 1 – 11, 2000929. DOI : 10.1002/admt.202000929.J. Jang; P. V. Warriam Sasikumar; F. Navaee; L. Hagelüken; G. Blugan et al.
Ceramics International. 2020. Vol. 47, num. 6, p. 7593 – 7601. DOI : 10.1016/j.ceramint.2020.11.098.V. Agnolon; D. Kiseljak; M. J. Wurm; F. M. Wurm; C. Foissard et al.
Frontiers In Immunology. 2020. Vol. 11, p. 586595. DOI : 10.3389/fimmu.2020.586595.M. Grisi; G. M. Conley; K. J. Rodriguez; E. Riva; L. Egli et al.
Scientific Reports. 2020. Vol. 10, p. 1 – 9, 18306. DOI : 10.1038/s41598-020-75480-0.X. Liu; A. K. Sachan; S. T. Howell; A. Conde-Rubio; A. W. Knoll et al.
Nano Letters. 2020. Vol. 20, num. 11, p. 8250 – 8257. DOI : 10.1021/acs.nanolett.0c03358.Y. Wang; G. Boero; X. Zhang; J. Brugger
Advanced Materials Interfaces. 2020. Vol. 7, num. 17, p. 2070095. DOI : 10.1002/admi.202070095.Z. Mohammadi; T. L. Heugel; J. M. L. Miller; D. D. Shin; H-K. Kwon et al.
New Journal Of Physics. 2020. Vol. 22, num. 9, p. 093049. DOI : 10.1088/1367-2630/abb1dd.L. Zhu; B. Xu; X. Wu; J. Lei; D. L. Hacker et al.
3 Biotech. 2020. Vol. 10, num. 9, p. 397. DOI : 10.1007/s13205-020-02352-9.M. Makowska; P. V. W. Sasikumar; L. Hagelüken; D. F. Sanchez; N. Casati et al.
Acta Materialia. 2020. Vol. 198, p. 134 – 144. DOI : 10.1016/j.actamat.2020.07.067.Y. Wang; G. Boero; X. Zhang; J. Brugger
Advanced Materials Interfaces. 2020. Vol. 7, num. 17, p. 2000733. DOI : 10.1002/admi.202000733.S. Tumpara; B. Martinez-Delgado; G. Gomez-Mariano; B. Liu; D. S. DeLuca et al.
Frontiers In Pharmacology. 2020. Vol. 11, p. 983. DOI : 10.3389/fphar.2020.00983.N. Sahin Solmaz; M. Grisi; A. V. Matheoud; G. Gualco; G. Boero
Analytical Chemistry. 2020. Vol. 92, num. 14, p. 9782 – 9789. DOI : 10.1021/acs.analchem.0c01221.X. Liu; S. T. Howell; A. Conde-Rubio; G. Boero; J. Brugger
Advanced Materials. 2020. p. 2001232. DOI : 10.1002/adma.202001232.G. Konstantinou; E. Kakkava; L. Hagelüken; P. V. Warriam Sasikumar; J. Wang et al.
Additive Manufacturing. 2020. p. 101343. DOI : 10.1016/j.addma.2020.101343.P. V. W. Sasikumar; E. Mueller; P. Clement; J. Jang; E. Kakkava et al.
Acs Applied Materials & Interfaces. 2020. Vol. 12, num. 15, p. 17244 – 17253. DOI : 10.1021/acsami.0c01465.G. Meligrana; S. Ferrari; L. Lucherini; J. Cele; F. Colo et al.
Chemelectrochem. 2020. Vol. 7, num. 7, p. 1652 – 1659. DOI : 10.1002/celc.202000345.T. Walger; T. Besson; V. Flauraud; R. D. Hersch; J. Brugger
Journal of the Optical Society of America. 2020. Vol. A37, num. 2, p. 209 – 218. DOI : 10.1364/JOSAA.37.000209.T. Walger; T. Besson; V. Flauraud; R. D. Hersch; J. Brugger
Optics Express. 2019. Vol. 27, num. 26, p. 37419 – 37434. DOI : 10.1364/OE.27.037419.S. Ilik; A. Kabaoglu; N. S. Solmaz; M. B. Yelten
Ieee Transactions On Electron Devices. 2019. Vol. 66, num. 11, p. 4617 – 4622. DOI : 10.1109/TED.2019.2926931.S. Hettler; L. Radtke; L. Grünewald; Y. Lisunova; O. Peric et al.
Micron. 2019. Vol. 127, p. 102753. DOI : 10.1016/j.micron.2019.102753.A. V. Matheoud; N. Sahin Solmaz; L. Frehner; G. Boero
Sensors and Actuators A: Physical. 2019. Vol. 295, p. 259 – 265. DOI : 10.1016/j.sna.2019.05.041.Z. Su; H. S. C. Yu; X. Zhang; J. Brugger; H. Zhang
Advanced Materials Technologies. 2019. p. 1900398. DOI : 10.1002/admt.201900398.M. Rüegg; R. Blum; G. Boero; J. Brugger
Advanced Functional Materials. 2019. Vol. 29, num. 39, p. 1903051. DOI : 10.1002/adfm.201903051.M. Grisi; E. Montinaro; F. Vincent; L. Petho; M. C. Letizia et al.
Chimia. 2019. Vol. 73, num. 7-8, p. 635 – 635. DOI : 10.2533/chimia.2019.635.A. V. Matheoud; N. Sahin Solmaz; G. Boero
IEEE Transactions on Microwave Theory and Techniques. 2019. Vol. 67, num. 7, p. 2782 – 2792. DOI : 10.1109/TMTT.2019.2916552.C. Giovinazzo; J. Sandrini; E. Shahrabi; O. T. Celik; Y. Leblebici et al.
Acs Applied Electronic Materials. 2019. Vol. 1, num. 6, p. 900 – 909. DOI : 10.1021/acsaelm.9b00094.A. Beaumont; M. Buzio; G. Boero
Review Of Scientific Instruments. 2019. Vol. 90, num. 6, p. 065005. DOI : 10.1063/1.5097508.M. Grisi; G. M. Conley; P. Sommer; J. Tinembart; G. Boero
Review Of Scientific Instruments. 2019. Vol. 90, num. 1, p. 015001. DOI : 10.1063/1.5066436.M. Rüegg; R. Blum; G. Boero; J. Brugger
Advanced Functional Materials. 2019. Vol. 29, num. 39, p. 1970270. DOI : 10.1002/adfm.201970270.C. Rawlings; Y. K. Ryu; M. Rüegg; N. Lassaline; C. Schwemmer et al.
Nanotechnology. 2018. Vol. 29, num. 50, p. 505302. DOI : 10.1088/1361-6528/aae3df.R. J. Hafner; L. Tian; J. C. Brauer; T. Schmaltz; A. Sienkiewicz et al.
Acs Nano. 2018. Vol. 12, num. 9, p. 9116 – 9125. DOI : 10.1021/acsnano.8b03165.A. V. Matheoud; N. Sahin; G. Boero
Journal of Magnetic Resonance. 2018. Vol. 294, p. 59 – 70. DOI : 10.1016/j.jmr.2018.07.002.E. Montinaro; M. Grisi; M. C. Letizia; L. Pethö; M. A. M. Gijs et al.
PLOS ONE. 2018. Vol. 13, num. 5, p. e0192780. DOI : 10.1371/journal.pone.0192780.I. Sharma; Y. Batra; V. Flauraud; J. Brugger; B. R. Mehta
Journal of Nanoscience and Nanotechnology. 2018. Vol. 18, num. 3, p. 1824 – 1832. DOI : 10.1166/jnn.2018.14265.S. Wu; F. Zuber; K. Maniura-Weber; J. Brugger; Q. Ren
Journal of Nanobiotechnology. 2018. Vol. 16, num. 1, p. 20. DOI : 10.1186/s12951-018-0347-0.E. Simonenko; N. Simonenko; A. Mokrushin; A. Vasiliev; I. Vlasov et al.
RUSSIAN JOURNAL OF INORGANIC CHEMISTRY. 2018. Vol. 63, num. 7, p. 851 – 860. DOI : 10.1134/S0036023618070197.A. Efimov; P. Arsenov; T. Maeder; V. Ivanov
ORIENTAL JOURNAL OF CHEMISTRY. 2018. Vol. 34, num. 1, p. 214 – 221. DOI : 10.13005/ojc/340124.X-S. Zhang; M. Han; B. Kim; J-F. Bao; J. Brugger et al.
Nano Energy. 2018. Vol. 47, p. 410 – 426. DOI : 10.1016/j.nanoen.2018.02.046.R. O’Kennedy; J. Fitzgerald; A. Cassedy; A. Crawley; X. Zhang et al.
Journal of Micromechanics and Microengineering. 2018. Vol. 28, num. 6, p. 063001. DOI : 10.1088/1361-6439/aab225.A. Varfolomeev; V. Solovey; I. Volkov; T. Maeder
ORIENTAL JOURNAL OF CHEMISTRY. 2018. Vol. 34, num. 1, p. 24 – 29. DOI : 10.13005/ojc/340102.S. Lisovskii; V. Ivanov; E. Korostylev; A. Meganov; M. Urazov et al.
Journal of Luminescence. 2018. Vol. 196, p. 94 – 99. DOI : 10.1016/j.jlumin.2017.11.033.P. Winkler; R. Regmi; V. Flauraud; J. Brugger; H. Rigneault et al.
The Journal of Physical Chemistry Letters. 2018. num. 9, p. 110 – 119. DOI : 10.1021/acs.jpclett.7b02818.V. Flauraud; R. Regmi; P. M. Winkler; D. T. L. Alexander; H. Rigneault et al.
Nano Letters. 2017. Vol. 17, num. 3, p. 1703 – 1710. DOI : 10.1021/acs.nanolett.6b04978.M. Grisi; F. Vincent; B. Volpe; R. Guidetti; N. Harris et al.
Scientific Reports. 2017. Vol. 7, p. 44670. DOI : 10.1038/srep44670.S. T. Zimmermann; D. W. H. Balkenende; A. Lavrenova; C. Weder; J. Brugger
ACS Applied Materials and Interfaces. 2017. Vol. 9, num. 47, p. 41454 – 41461. DOI : 10.1021/acsami.7b13672.V. Flauraud; G. D. Bernasconi; J. Butet; D. T. L. Alexander; O. J. F. Martin et al.
ACS Nano. 2017. Vol. 11, num. 4, p. 3485 – 3495. DOI : 10.1021/acsnano.6b08589.P. M. Winkler; R. Regmi; V. Flauraud; J. Brugger; H. Rigneault et al.
ACS Nano. 2017. Vol. 11, num. 7, p. 7241 – 7250. DOI : 10.1021/acsnano.7b03177.Y. Lisunova; M. Spieser; R. Juttin; F. Holzner; J. Brugger
Microelectronic Engineering. 2017. Vol. 180, p. 20 – 24. DOI : 10.1016/j.mee.2017.04.006.X. Zhang; M. Su; J. Brugger; B. Kim
Nano Energy. 2017. Vol. 33, p. 393 – 401. DOI : 10.1016/j.nanoen.2017.01.053.V. Flauraud; M. Reyes; R. Paniagua-Dominguez; A. Kuznetsov; J. Brugger
ACS Photonics. 2017. Vol. 4, num. 8, p. 1913 – 1919. DOI : 10.1021/acsphotonics.6b01021.T. Oellers; D. Koenig; A. Kostka; S. Xie; J. Brugger et al.
Acs Combinatorial Science. 2017. Vol. 19, num. 9, p. 574 – 584. DOI : 10.1021/acscombsci.7b00065.P. Fesenko; V. Flauraud; S. Xie; E. Kang; T. Uemura et al.
ACS Applied Materials & Interfaces. 2017. Vol. 9, num. 28, p. 23314 – 23318. DOI : 10.1021/acsami.7b06584.R. Regmi; P. M. Winkler; V. Flauraud; K. J. E. Borgman; C. Manzo et al.
Nano Letters. 2017. Vol. 17, num. 10, p. 6295 – 6302. DOI : 10.1021/acs.nanolett.7b02973.C. D. Rawlings; M. Zientek; M. Spieser; D. Urbonas; T. Stöferle et al.
Scientific Reports. 2017. Vol. 7, num. 1, p. 16502. DOI : 10.1038/s41598-017-16496-x.M. A. Chavarria; A. V. Matheoud; P. Marmillod; Y. Liu; D. Kong et al.
Review of Scientific Instruments. 2017. Vol. 88, num. 3, p. 035115 – 1. DOI : 10.1063/1.4978960.A. V. Matheoud; G. Gualco; M. Jeong; I. Zivkovic; J. Brugger et al.
Journal of Magnetic Resonance. 2017. Vol. 278, p. 113 – 121. DOI : 10.1016/j.jmr.2017.03.013.V. Flauraud; G. D. Bernasconi; J. Butet; M. Mastrangeli; D. T. L. Alexander et al.
ACS Photonics. 2017. Vol. 4, num. 7, p. 1661 – 1668. DOI : 10.1021/acsphotonics.6b01026.V. Flauraud; M. Mastrangeli; G. D. Bernasconi; J. Butet; D. T. L. Alexander et al.
Nature Nanotechnology. 2017. Vol. 12, num. 1, p. 73 – 80. DOI : 10.1038/nnano.2016.179.J. Anders; J. Handwerker; M. Ortmanns; G. Boero
Journal Of Magnetic Resonance. 2016. Vol. 266, p. 41 – 50. DOI : 10.1016/j.jmr.2016.03.004.I. Volkov; A. Varfolomeev; S. Krasnoselsky; V. Ivanov; T. Maeder
Oriental Journal of Chemistry. 2016. Vol. 32, num. 6, p. 2857 – 2861. DOI : 10.13005/ojc/320603.F. Dalcanale; J. Grossenbacher; G. Blugan; M. Gullo; J. Brugger et al.
Journal of Colloid and Interface Science. 2016. Vol. 470, num. 15, p. 123 – 131. DOI : 10.1016/j.jcis.2016.02.050.M. Gauvin; T. Alnasser; E. Terver; I. Abid; A. Mlayah et al.
Nanoscale. 2016. Vol. 8, num. 36, p. 16162 – 16167. DOI : 10.1039/c6nr05091c.B. Singh; B. Mehta; D. Varandani; A. V. Savu; J. Brugger
Journal of Nanoscience and Nanotechnology. 2016. Vol. 16, num. 4, p. 4044 – 4051. DOI : 10.1166/jnn.2016.10713.S. Wu; F. Zuber; J. Brugger; K. Maniura-Weber; Q. Ren
Nanoscale. 2016. Vol. 8, num. 5, p. 2620 – 2625. DOI : 10.1039/C5NR06157A.J. Adams; B. Erickson; J. Grossenbacher; J. Brugger; A. P. Nievergelt et al.
Nature Nanotechnology. 2016. Vol. 11, p. 147 – 151. DOI : 10.1038/NNANO.2015.254.F. Yesilkoy; R. Ueno; B. Desbiolles; M. Grisi; Y. Sakai et al.
Biomicrofluidics – Fundamentals, Perspectives & Applications. 2016. Vol. 10, num. 1, p. 014120. DOI : 10.1063/1.4942457.F. Yesilkoy; V. Flauraud; M. Rüegg; B. Kim; J. Brugger
Nanoscale. 2016. Vol. 9, p. 4945 – 4950. DOI : 10.1039/C5NR08444J.R. H. Vafaie; H. B. Ghavifekr; H. Van Lintel; J. Brugger; P. Renaud
ELECTROPHORESIS. 2016. Vol. 37, num. 5-6, p. 719 – 726. DOI : 10.1002/elps.201500404.M. Gauvin; J. Grisolia; T. Alnasser; B. Viallet; S. Xie et al.
Nanoscale. 2016. Vol. 8, num. 22, p. 11363 – 11370. DOI : 10.1039/C6NR02004F.P. Fesenko; V. Flauraud; S. Xie; J. Brugger; J. Genoe et al.
Crystal Growth & Design. 2016. Vol. 16, p. 4694−4700. DOI : 10.1021/acs.cgd.6b00765.D. Varandani; K. Agarwal; J. Brugger; B. R. Mehta
Review Of Scientific Instruments. 2016. Vol. 87, num. 8, p. 084903. DOI : 10.1063/1.4960332.E. Wagner; C. S. Sandu; S. Harada; G. Benvenuti; V. Savu et al.
Thin Solid Films. 2015. Vol. 586, p. 64 – 69. DOI : 10.1016/j.tsf.2015.04.021.S. Wu; T. M. Braschler; R. Anker; F. Wildhaber; A. Bertsch et al.
Journal of Membrane Science. 2015. Vol. 477, num. 1, p. 151 – 156. DOI : 10.1016/j.memsci.2014.12.023.J. Grossenbacher; R. M. Gullo; V. Bakumov; G. Blugan; J. Kuebler et al.
Ceramics International. 2015. Vol. 41, num. 1, p. 623 – 629. DOI : 10.1016/j.ceramint.2014.08.112.S. Wu; W. Ye; M. Yang; M. Taghipoor; R. Meissner et al.
Sensors and Actuators B: Chemical. 2015. Vol. 216, p. 105 – 112. DOI : 10.1016/j.snb.2015.03.094.V. Flauraud; T. S. van Zanten; M. Mivelle; C. Manzo; M. F. Garcia Parajo et al.
Nano Letters. 2015. Vol. 15, num. 6, p. 4176 – 4182. DOI : 10.1021/acs.nanolett.5b01335.F. Dalcanale; J. Grossenbacher; G. Blugan; M. R. Gullo; J. Brugger et al.
Journal of the European Ceramic Society. 2015. Vol. 35, num. 8, p. 2215 – 2224. DOI : 10.1016/j.jeurceramsoc.2015.02.016.R. Ueno; F. Yesilköy; J. Brugger; B. Kim
IEEJ Transactions on Sensors and Micromachines. 2015. Vol. 135, num. 8, p. 338 – 342. DOI : 10.1541/ieejsmas.135.338.J. Grossenbacher; M. Gullo; F. Dalcanale; G. Blugan; J. Kuebler et al.
Journal of Biomedical Materials Research Part A. 2015. Vol. 103, num. 11, p. 3625 – 3632. DOI : 10.1002/jbm.a.35477.L. Jacot-Descombes; V. J. Cadarso; A. Schleunitz; S. Gruetzner; J. J. Klein et al.
Optics Express. 2015. Vol. 23, num. 19, p. 25365 – 25376. DOI : 10.1364/OE.23.025365.G. Arutinov; M. Mastrangeli; E. C. P. Smits; G. van Heck; J. M. J. den Toonder et al.
Journal of Microelectromechanical Systems. 2015. Vol. 24, num. 1, p. 126 – 133. DOI : 10.1109/JMEMS.2014.2321013.F. Dalcanale; J. Grossenbacher; G. Blugan; R. M. Gullo; A. Lauria et al.
Journal of the European Ceramic Society. 2014. Vol. 34, num. 15, p. 3559 – 3570. DOI : 10.1016/j.jeurceramsoc.2014.06.002.M. Guillaumee; S. P. Vahdati; E. Tremblay; A. Mader; G. Bernasconi et al.
Journal Of Display Technology. 2014. Vol. 10, num. 6, p. 444 – 449. DOI : 10.1109/Jdt.2013.2277933.V. J. Cadarso; T. Kiefer; V. Auzelyte; H. Atasoy; G. Gruetzner et al.
Microsystem Technologies-Micro-And Nanosystems-Information Storage And Processing Systems. 2014. Vol. 20, num. 10-11, p. 1961 – 1966. DOI : 10.1007/s00542-013-2016-4.M. Marelli; N. Gadhari; G. Boero; M. Chiquet; J. Brugger
Lab on a Chip. 2014. Vol. 14, num. 2, p. 286 – 293. DOI : 10.1039/c3lc51021b.S. De Pedro; V. J. Cadarso; X. Munoz-Berbel; J. A. Plaza; J. Sort et al.
Sensors And Actuators A-Physical. 2014. Vol. 215, p. 30 – 35. DOI : 10.1016/j.sna.2014.01.021.S. De Pedro; V. J. Cadarso; T. N. Ackermann; X. Munoz-Berbel; J. A. Plaza et al.
Journal Of Micromechanics And Microengineering. 2014. Vol. 24, num. 12, p. 125008. DOI : 10.1088/0960-1317/24/12/125008.V. J. Cadarso; J. Perera-Nunez; A. Mendez-Vilas; L. Labajos-Broncano; M-L. Gonzalez-Martin et al.
Journal Of Materials Research. 2014. Vol. 29, num. 17, p. 2100 – 2107. DOI : 10.1557/jmr.2014.162.J. Ho Choi; Y. Ho Kim; L. Jacot-Descombes; J. Brugger; G. Man Kim
Journal of the Korean Society for Precision Engineering. 2014. Vol. 31, num. 8, p. 743 – 747. DOI : 10.7736/KSPE.2014.31.8.743.S. De Pedro; A. Voigt; V. J. Cadarso; J. Vila-Planas; J. Brugger et al.
Microelectronic Engineering. 2014. Vol. 115, p. 1 – 1. DOI : 10.1016/j.mee.2013.10.019.A. Gopakumar; Z. Fei; E. Paunescu; V. Auzelyte; J. Brugger et al.
The Journal of Physical Chemistry. 2014. Vol. 118, p. 16743−16748. DOI : 10.1021/jp412722y.O. Ergeneman; C. Peters; M. R. Gullo; L. Jacot-Descombes; S. Gervasoni et al.
Nanoscale. 2014. Vol. 6, p. 10495 – 10499. DOI : 10.1039/C3NR06442E.L. Jacot-Descombes; M. R. Gullo; V. J. Cadarso; M. Mastrangeli; O. Ergeneman et al.
Micromachines. 2014. Vol. 5, p. 583 – 593. DOI : 10.3390/mi5030583.M. Mastrangeli; A. Martinoli; J. Brugger
Microelectronic Engineering. 2014. Vol. 124, p. 1 – 7. DOI : 10.1016/j.mee.2014.04.017.G. Gualco; J. Anders; A. Sienkiewicz; S. Alberti; L. Forro et al.
Journal of Magnetic Resonance. 2014. Vol. 247, p. 96 – 103. DOI : 10.1016/j.jmr.2014.08.013.R. Menchon-Enrich; A. Llobera; J. Vila-Planas; V. J. Cadarso; J. Mompart et al.
Light-Science & Applications. 2013. Vol. 2, p. e90. DOI : 10.1038/lsa.2013.46.M. S. Gabureac; L. Bernau; G. Boero; I. Utke
Ieee Transactions On Nanotechnology. 2013. Vol. 12, num. 5, p. 668 – 673. DOI : 10.1109/Tnano.2013.2266733.S. Brun; V. Savu; S. Schintke; E. Guibert; H. Keppner et al.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2013. Vol. 306, p. 292 – 295. DOI : 10.1016/j.nimb.2012.12.064.S. Wu; F. Wildhaber; A. Bertsch; J. Brugger; P. Renaud
Applied Physics Letters. 2013. Vol. 102, num. 21, p. 213108.1 – 4. DOI : 10.1063/1.4807781.N. Gadhari; M. Chamley; M. Marelli; J. Brugger; M. Chiquet
Biochimica et Biophysica Acta (BBA) – Molecular Cell Research. 2013. Vol. 1833, num. 12, p. 3415 – 3425. DOI : 10.1016/j.bbamcr.2013.10.012.G. Boero; G. Gualco; R. Lisowski; J. Anders; D. Suter et al.
Journal Of Magnetic Resonance. 2013. Vol. 231, p. 133 – 140. DOI : 10.1016/j.jmr.2013.04.004.W. Fang; M. Esashi; R. Ghodssi; J. Brugger
Ieee Sensors Journal. 2013. Vol. 13, num. 8, p. 2809 – 2809. DOI : 10.1109/Jsen.2013.2268687.V. Auzelyte; B. Gallinet; V. Flauraud; C. Santschi; S. Dutta-Gupta et al.
Advanced Optical Materials. 2013. Vol. 1, num. 1, p. 50 – 54. DOI : 10.1002/adom.201200017.L. G. Villanueva; O. Vazquez-Mena; C. Martin-Olmos; A. V. Savu; K. Sidler et al.
Micromachines. 2013. Vol. 4, p. 370 – 377. DOI : 10.3390/mi4040370.D. Lehmhus; J. Brugger; P. Muralt; S. Pane; O. Ergeneman et al.
Journal Of Intelligent Material Systems And Structures. 2013. Vol. 24, num. 18, p. 2171 – 2171. DOI : 10.1177/1045389X13507157.J. Y. Kim; C. Martin-Olmos; N. S. Baek; J. Brugger
Journal Of Materials Chemistry C. 2013. Vol. 1, num. 11, p. 2152 – 2157. DOI : 10.1039/c3tc00632h.V. J. Cadarso; S. Chosson; K. Sidler; R. D. Hersch; J. Brugger
Light: Science & Applications. 2013. Vol. 2, num. 7, p. e86. DOI : 10.1038/lsa.2013.42.J. Henriksson; R. M. Gullo; J. Brugger
IEEE Sensors Journal. 2013. Vol. 13, num. 8, p. 2849 – 2856. DOI : 10.1109/JSEN.2013.2261293.C. Pahud; V. Savu; M. Klein; O. Vazquez-Mena; F-J. Haug et al.
Ieee Journal Of Photovoltaics. 2013. Vol. 3, num. 1, p. 22 – 26. DOI : 10.1109/Jphotov.2012.2213583.G. Arutinov; M. Mastrangeli; E. C. P. Smiths; H. F. M. Schoo; J. Brugger et al.
Applied Physics Letters. 2013. Vol. 102, p. 144101. DOI : 10.1063/1.4801088.L. Jacot-Descombes; R. M. Gullo; M. Mastrangeli; V. J. Cadarso; J. Brugger
IET Micro & Nano Letters. 2013. Vol. 8, num. 10, p. 633 – 636. DOI : 10.1049/mnl.2013.0241.L. Jacot-Descombes; C. Martin-Olmos; M. R. Gullo; V. J. Cadarso; G. Mermoud et al.
Soft Matter. 2013. Vol. 9, p. 9931 – 9938. DOI : 10.1039/c3sm51923f.J. Goldowsky; M. Mastrangeli; L. Jacot-Descombes; R. M. Gullo; G. Mermoud et al.
Journal of Micromechanics and Microengineering. 2013. Vol. 23, num. 12, p. 125026. DOI : 10.1088/0960-1317/23/12/125026.J. Anders; P. SanGiorgio; X. Deligianni; F. Santini; K. Scheffler et al.
Magnetic Resonance In Medicine. 2012. Vol. 67, p. 290 – 296. DOI : 10.1002/mrm.23112.J. Anders; A. Angerhofer; G. Boer
Journal Of Magnetic Resonance. 2012. Vol. 217, p. 19 – 26. DOI : 10.1016/j.jmr.2012.02.003.J. Anders; M. Ortmanns; K. Scheffler; G. Boero
Biomedical Engineering-Biomedizinische Technik. 2012. Vol. 57, p. 907. DOI : 10.1515/bmt-2012-4407.E. Zanchetta; V. Auzelyte; J. Brugger; A. V. Savegnago; G. Della Giustina et al.
Microelectronic Engineering. 2012. Vol. 98, p. 176 – 179. DOI : 10.1016/j.mee.2012.07.043.L. Jacot-Descombes; R. M. Gullo; C. Busto; V. Javier; J. Brugger
Journal of Micromechanics and Microengineering. 2012. Vol. 22, num. 7, p. 074012. DOI : 10.1088/0960-1317/22/7/074012.J. Y. Kim; K. Pfeiffer; A. Voigt; G. Gruetzner; J. Brugger
Journal of Materials Chemistry. 2012. Vol. 22, num. 7, p. 3053 – 3058. DOI : 10.1039/c2jm15576a.E. Binetti; C. Ingrosso; M. Striccoli; P. Cosma; A. Agostiano et al.
Nanotechnology. 2012. Vol. 23, num. 7, p. 075701. DOI : 10.1088/0957-4484/23/7/075701.S. Wu; F. Wildhaber; O. Vazquez-Mena; A. Bertsch; J. Brugger et al.
Nanoscale. 2012. Vol. 4, num. 18, p. 5718 – 5723. DOI : 10.1039/c2nr31243c.B. Singh; B. R. Mehta; D. Varandani; A. V. Savu; J. Brugger
Nanotechnology. 2012. Vol. 23, num. 49, p. 495707. DOI : 10.1088/0957-4484/23/49/495707.K. Pataky; T. Braschler; A. Negro; P. Renaud; M. P. Lutolf et al.
Advanced Materials. 2012. Vol. 24, num. 3, p. 391 – 396. DOI : 10.1002/adma.201102800.O. Vazquez Mena; T. Sannomiya; M. Tosun; G. Villanueva; A. V. Savu et al.
ACS Nano. 2012. Vol. 6, num. 6, p. 5474 – 5481. DOI : 10.1021/nn301358n.C. Martin-Olmos; G. Villanueva; P. van der Wal; A. Llobera; N. de Rooij et al.
Advanced Functional Materials. 2012. Vol. 22, num. 7, p. 1482 – 1488. DOI : 10.1002/adfm.201102789.G. Villanueva; O. Vazquez-Mena; C. Martin-Olmos; V. Savu; K. Sidler et al.
Journal of Micromechanics and Microengineering. 2012. Vol. 22, num. 9, p. 095022. DOI : 10.1088/0960-1317/22/9/095022.J. Henriksson; L. G. Villanueva; J. Brugger
Nanoscale. 2012. Vol. 4, num. 16, p. 5059 – 5064. DOI : 10.1039/C2NR30639E.L. G. Villanueva; F. Fargier; T. Kiefer; M. Ramonda; J. Brugger et al.
Nanoscale. 2012. Vol. 4, p. 1964 – 1967. DOI : 10.1039/C2NR11983H.K. Sidler; G. Villanueva; O. Vazquez-Mena; V. Savu; J. Brugger
Nanoscale. 2012. Vol. 4, p. 773 – 778. DOI : 10.1039/c2nr11609j.M. Frantlović; I. Jokić; V. Savu; S. Xie; J. Brugger
Microelectronic Engineering. 2012. Vol. 98, p. 230 – 233. DOI : 10.1016/j.mee.2012.07.016.S. De Pedro; A. Voigt; V. J. Cadarso; J. Vila-Planas; J. Brugger et al.
Microelectronic Engineering. 2012. Vol. 98, p. 234 – 237. DOI : 10.1016/j.mee.2012.07.013.D. Sacchetto; S. Xie; V. Savu; M. Zervas; G. De Micheli et al.
Microelectronic Engineering. 2012. Vol. 98, p. 355 – 358. DOI : 10.1016/j.mee.2012.07.048.V. Bakumov; G. Blugan; S. Roos; T. Graule; V. Fakhfouri et al.
Journal of the European Ceramic Society. 2012. Vol. 32, num. 8, p. 1759 – 1767. DOI : 10.1016/j.jeurceramsoc.2012.01.007.L. Brigo; V. Auzelyte; K. Lister; J. Brugger; G. Brusatin
Nanotechnology. 2012. Vol. 23, p. 325302. DOI : 10.1088/0957-4484/23/32/325302.K. Sidler; N. V. Cvetkovic; D. Tsamados; A. M. Ionescu; J. Brugger et al.
Microelectronic Engineering. 2012. Vol. 98, p. 508 – 511. DOI : 10.1016/j.mee.2012.07.080.N. V. Cvetkovic; K. Sidler; V. Savu; J. Brugger; D. Tsamados et al.
Microelectronic Engineering. 2012. Vol. 100, p. 47 – 50. DOI : 10.1016/j.mee.2012.07.110.J. V. Cadarso; G. Smolik; V. Auzelyte; L. Jacot-Descombes; J. Brugger
Microelectronic Engineering. 2012. Vol. 98, p. 619 – 622. DOI : 10.1016/j.mee.2012.04.025.G. Arutinov; E. C. P. Smits; M. Mastrangeli; G. van Heck; J. van den Brand et al.
Journal of Micromechanics and Microengineering. 2012. Vol. 22, p. 115022. DOI : 10.1088/0960-1317/22/11/115022.J. Anders; P. SanGiorgio; G. Boero
Journal Of Magnetic Resonance. 2011. Vol. 209, p. 1 – 7. DOI : 10.1016/j.jmr.2010.12.005.T. Braschler; A. Valero; L. Colella; K. Pataky; J. Brugger et al.
Analytical Chemistry. 2011. Vol. 83, num. 6, p. 2234 – 2242. DOI : 10.1021/ac103118r.V. J. Cadarso Busto; J. Perera-Núñez; L. Jacot-Descombes; K. Pfeiffer; U. Ostrzinski et al.
Optics Express. 2011. Vol. 19, num. 19, p. 18665. DOI : 10.1364/OE.19.018665.D. Sacchetto; V. Savu; G. De Micheli; J. Brugger; Y. Leblebici
Microelectronic Engineering. 2011. Vol. 88, num. 8, p. 2732 – 2735. DOI : 10.1016/j.mee.2010.12.117.J. Y. Kim; N. B. Brauer; V. Fakhfouri; D. Boiko; E. Charbon et al.
Optical Materials Express. 2011. Vol. 1, num. 2, p. 259 – 269. DOI : 10.1364/OME.1.000259.O. Vazquez-Mena; K. Sidler; V. Savu; C. W. Park; L. G. Villanueva et al.
IEEE Transactions on Nanotechnology. 2011. Vol. 10, num. 2, p. 352 – 357. DOI : 10.1109/TNANO.2010.2042724.O. Vazquez-Mena; T. Sannomiya; L. G. Villanueva; J. Voros; J. Brugger
ACS Nano. 2011. Vol. 5, num. 2, p. 844 – 853. DOI : 10.1021/nn1019253.G. Villanueva; C. Martin Olmos; O. Vazquez Mena; J. Montserrat; P. Langlet et al.
IEEE Transactions on Nanotechnology. 2011. Vol. 10, num. 5, p. 940 – 946. DOI : 10.1109/TNANO.2010.2090171.F. D. Fleischli; K. Sidler; M. Schaer; V. Savu; J. Brugger et al.
Organic Electronics. 2011. Vol. 12, num. 2, p. 336 – 340. DOI : 10.1016/j.orgel.2010.12.004.D. S. Engstrom; V. Savu; X. Zhu; I. Y. Y. Bu; W. I. Milne et al.
Nano Letters. 2011. Vol. 11, num. 4, p. 1568 – 1574. DOI : 10.1021/nl104384b.M. J. K. Klein; F. Montagne; N. Blondiaux; O. Vazquez-Mena; H. Heinzelmann et al.
Journal of Vacuum Science & Technology B. 2011. Vol. 29, num. 2, p. 021012/1 – 5. DOI : 10.1116/1.3554404.C. Ingrosso; C. Martin-Olmos; A. Llobera; C. Innocenti; C. Sangregorio et al.
Nanoscale. 2011. Vol. 3, p. 4632 – 4639. DOI : 10.1039/c1nr10487j.S. Xie; V. Savu; W. Tang; O. Vazquez-Mena; K. Sidler et al.
Microelectronic Engineering. 2011. Vol. 88, p. 2790 – 2793. DOI : 10.1016/j.mee.2010.11.056.A. Llobera; V. J. Cadarso Busto; E. Carregal-Romero; J. Brugger; C. Domínguez et al.
Optics Express. 2011. Vol. 19, num. 6, p. 5026 – 5039. DOI : 10.1364/OE.19.005026.A. V. Savu; S. Xie; J. Brugger
Nanoscale. 2011. Vol. 3, num. 7, p. 2739. DOI : 10.1039/c1nr10083a.M. Gabureac; L. Bernau; I. Utke; G. Boero
Nanotechnology. 2010. Vol. 21, num. 11, p. 115503. DOI : 10.1088/0957-4484/21/11/115503.G. Weber; N. Blondiaux; M. Giazzon; N. Matthey; M. J. K. Klein et al.
Langmuir. 2010. Vol. 26, num. 11, p. 8180 – 8186. DOI : 10.1021/la904526u.K. Sidler; N. Cvetkovic; A. V. Savu; D. Tsamados; M. A. Ionescu et al.
Sensors and Actuators A. 2010. Vol. 162, num. 2, p. 155 – 159. DOI : 10.1016/j.sna.2010.04.016.E. Milyutin; S. Harada; D. Martin; J. F. Carlin; N. Grandjean et al.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 2010. Vol. 28, num. 6, p. L61. DOI : 10.1116/1.3501117.T. Kiefer; G. Villanueva; F. Fargier; F. G. Favier; J. Brugger
Nanotechnology. 2010. Vol. 21, num. 50, p. 505501. DOI : 10.1088/0957-4484/21/50/505501.T. Kiefer; A. Salette; G. Villanueva; J. Brugger
Journal of Micromechanics and Microengineering. 2010. Vol. 20, p. 105019. DOI : 10.1088/0960-1317/20/10/105019.V. Savu; S. Neuser; G. Villanueva; O. Vazquez-Mena; K. Sidler et al.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 2010. Vol. 28, num. 1, p. 169 – 172. DOI : 10.1116/1.3292630.V. J. Cadarso; A. Llobera; G. Villanueva; J. A. Plaza; J. Brugger et al.
Sensors and Actuators a-Physical. 2010. Vol. 162, num. 2, p. 260 – 266. DOI : 10.1016/j.sna.2010.02.025.T. Kiefer; G. Villanueva; F. Fargier; F. Favier; J. Brugger
Applied Physics Letters. 2010. Vol. 97, num. 12, p. 121911. DOI : 10.1063/1.3491263.T. Braschler; A. Valero; L. Colella; K. Pataky; J. Brugger et al.
Lab on a Chip. 2010. Vol. 10, num. 20, p. 2771 – 2777. DOI : 10.1039/c004988c.D. Tsamados; N. V. Cvetkovic; K. Sidler; J. Bhandari; V. Savu et al.
Solid-State Electronics. 2010. Vol. 54, num. 9, p. 1003 – 1009. DOI : 10.1016/j.sse.2010.04.019.M. J. K. Klein; M. Guillaumée; B. Wenger; A. Dunbar; J. Brugger et al.
Nanotechnology. 2010. Vol. 21, num. 20, p. 205301. DOI : 10.1088/0957-4484/21/20/205301.V. J. Cadarso; K. Pfeiffer; U. Ostrzinski; J. B. Bureau; G. A. Racine et al.
Journal of Micromechanics and Microengineering. 2010. Vol. 21, num. 1, p. 017003. DOI : 10.1088/0960-1317/21/1/017003.G. Boero; S. Rusponi; P. Bencok; R. Meckenstock; J-U. Thiele et al.
Physical Review B. 2009. Vol. 79, num. 22, p. 224425. DOI : 10.1103/PhysRevB.79.224425.G. Boero; S. Rusponi; J. Kavich; A. L. Rizzini; C. Piamonteze et al.
Review of Scientific Instruments. 2009. Vol. 80, num. 12, p. 123902. DOI : 10.1063/1.3267192.J. Anders; G. Chiaramonte; P. SanGiorgio; G. Boero
Journal Of Magnetic Resonance. 2009. Vol. 201, p. 239 – 249. DOI : 10.1016/j.jmr.2009.09.019.C. Ingrosso; J. Y. Kim; E. Binetti; V. Fakhfouri; M. Striccoli et al.
Microelectronic Engineering. 2009. Vol. 86, p. 1124 – 1126. DOI : 10.1016/j.mee.2008.11.028.K. Pataky; L. G. Villanueva; A. Liani; O. Zgheib; N. Jenkins et al.
Radiation Research. 2009. Vol. 172, num. 2, p. 252 – 259. DOI : 10.1667/RR1483.1.O. Vazquez-Mena; L. G. Villanueva; V. Savu; K. Sidler; P. Langlet et al.
Nanotechnology. 2009. Vol. 20, num. 41, p. 415303. DOI : 10.1088/0957-4484/20/41/415303.C. Martin; A. Llobera; G. Villanueva; A. Voigt; G. Gruetzner et al.
Microelectronic Engineering. 2009. Vol. 86, num. 4-6, p. 1226 – 1229. DOI : 10.1016/j.mee.2008.12.033.T. Kiefer; G. Villanueva; J. Brugger
Physical Review E. 2009. Vol. 80, num. 2, p. 021104. DOI : 10.1103/Physreve.80.021104.V. Fakhfouri; G. Mermoud; J. Y. Kim; A. Martinoli; J. Brugger
Micro and Nanosystems. 2009. Vol. 1, num. 1, p. 63 – 67. DOI : 10.2174/1876402910901010063.C. Santschi; J. Przybylska; M. Guillaumee; O. Vazquez-Mena; J. Brugger et al.
Praktische Metallographie-Practical Metallography. 2009. Vol. 46, num. 3, p. 154 – 156.J. Arcamone; M. Sansa; J. Verd; A. Uranga; G. Abadal et al.
Small. 2009. Vol. 5, p. 176 – 180. DOI : 10.1002/smll.200990007.J. Y. Kim; C. Ingrosso; V. Fakhfouri; M. Striccoli; A. Agostiano et al.
Small. 2009. Vol. 5, p. 1051 – 1057. DOI : 10.1002/smll.200801315.O. Zgheib; K. Pataky; J. Brugger; T. D. Halazonetis
Molecular and Cellular Biology. 2009. Vol. 29, p. 1050 – 1058. DOI : 10.1128/MCB.01011-08.V. Savu; J. Kivioja; J. Ahopelto; J. Brugger
IEEE Transactions on Applied Superconductivity. 2009. Vol. 19, num. 3, p. 242 – 244. DOI : 10.1109/TASC.2009.2019075.J. Grisolia; B. Viallet; C. Amiens; S. Baster; A. Cordan et al.
Nanotechnology. 2009. Vol. 20, num. 35, p. 355303. DOI : 10.1088/0957-4484/20/35/355303.G. Boero; S. Mouaziz; S. Rusponi; P. Bencok; F. Nolting et al.
New journal of physics. 2008. Vol. 10, p. 013011. DOI : 10.1088/1367-2630/10/1/013011.D. Ramos; J. Tamayo; J. Mertens; M. Calleja; G. Villanueva et al.
Nanotechnology. 2008. Vol. 19, num. 3, p. 035503. DOI : 10.1088/0957-4484/19/03/035503.J. Y. Kim; D-G. Choi; J-H. Jeong; E-S. Lee
Applied Surface Science. 2008. Vol. 254, p. 4793 – 4796. DOI : 10.1016/j.apsusc.2008.01.095.G. Villanueva; J. A. Plaza; J. Montserrat; F. Perez-Murano; J. Bausells
Microelectronic Engineering. 2008. Vol. 85, num. 5-6, p. 1120 – 1123. DOI : 10.1016/j.mee.2008.01.082.J. Arcamone; M. van den Boogaart; F. Serra-Graells; J. Fraxedas; J. Brugger et al.
Nanotechnology. 2008. Vol. 19, num. 30, p. 305302. DOI : 10.1088/0957-4484/19/30/305302.K. W. Eberhardt; A. Hunkeler; U. Meier; J. Tharian; S. Mouaziz et al.
Physical Review B. 2008. Vol. 78, p. 214401 (5 pages). DOI : 10.1103/PhysRevB.78.214401.J. Arcamone; B. Misischi; F. Serra-Graells; M. A. F. van den Boogaart; J. Brugger et al.
Iet Circuits Devices & Systems. 2008. Vol. 2, p. 317 – 323. DOI : 10.1049/iet-cds:20070320.B. Viallet; J. Grisolia; L. Ressier; M. Van Den Boogaart; J. Brugger et al.
Microelectronics Engineering. 2008. Vol. 85, num. 8, p. 1705 – 1708. DOI : 10.1016/j.mee.2008.04.027.S. Krishnamoorthy; Y. Gerbig; C. Hibert; R. Pugin; C. Hinderling et al.
Nanotechnology. 2008. Vol. 19, num. 28, p. 285301. DOI : 10.1088/0957-4484/19/28/285301.S. Krishnamoorthy; R. Pugin; C. Hinderling; J. Brugger; H. Heinzelmann
Nanotechnology. 2008. Vol. 19, p. 175301. DOI : 10.1088/0957-4484/19/17/175301.T. Kiefer; F. Favier; O. Vazquez; G. Villanueva; J. Brugger
Nanotechnology. 2008. Vol. 19, num. 12, p. 125502. DOI : 10.1088/0957-4484/19/12/125502.O. Vazquez Mena; G. Villanueva; V. Savu; K. Sidler; M. A. F. van den Boogaart et al.
Nano Letters. 2008. Vol. 8, num. 11, p. 3675 – 3682. DOI : 10.1021/nl801778t.O. Vazquez-Mena; G. Villanueva; M. A. F. van den Boogaart; V. Savu; J. Brugger
Microelectronic Engineering. 2008. Vol. 85, num. 5-6, p. 1237 – 1240. DOI : 10.1016/j.mee.2007.12.083.G. Villanueva; O. Vazquez-Mena; M. A. F. van den Boogaart; K. Sidler; K. Pataky et al.
Microelectronic Engineering. 2008. Vol. 85, p. 1010 – 1014. DOI : 10.1016/j.mee.2007.12.068.C. Martin; A. Llobera; T. Leïchlé; G. Villanueva; A. Voigt et al.
Microelectronic Engineering. 2008. Vol. 85, p. 972 – 975. DOI : 10.1016/j.mee.2008.01.052.V. Savu; M. van den Boogaart; J. Brugger; J. Arcamone; M. Sansa et al.
Journal of Vacuum Science and Technology B. 2008. Vol. 26, p. 2054 – 2058. DOI : 10.1116/1.2987953.S. Krishnamoorthy; M. A. F. Van den Boogaart; J. Brugger; C. Hibert; R. Pugin et al.
Advanced Materials. 2008. Vol. 20, num. 18, p. 3533 – 3538. DOI : 10.1002/adma.200702478.R. Wiederkehr; M. Salvadori; J. Brugger; F. Degasperi; M. Cattani
Sensors and Actuators A. 2008. Vol. 144, p. 154 – 160. DOI : 10.1016/j.sna.2007.12.024.M. Lishchynska; M. van den Boogaart; V. Savu; J. Greer; J. Brugger
Microelectronic Engineering. 2008. Vol. 85, p. 2243 – 2249. DOI : 10.1016/j.mee.2008.07.009.S. Krishnamoorthy; R. Pugin; J. Brugger; H. Heinzelmann; C. Hinderling
Advanced Materials. 2008. Vol. 20, num. 10, p. 1962 – 1965. DOI : 10.1002/adma.200702005.V. Savu; L. Frunzio; D. E. Prober
IEEE Transactions on Applied Superconductivity. 2007. Vol. 17, num. 2, p. 324 – 327. DOI : 10.1109/TASC.2007.898612.J. Arcamone; B. Misischi; F. Serra-Graells; M. A. F. van den Boogaart; J. Brugger et al.
IEEE Transactions on Circuits and Systems II. 2007. Vol. 54, num. 5, p. 377 – 381. DOI : 10.1109/TCSII.2007.892228.H. Guo; D. Martrou; T. Zambelli; J. Polesel-Maris; A. Piednoir et al.
Applied Physics Letters. 2007. Vol. 90, num. 9, p. 093113. DOI : 10.1063/1.2710473.C. Dumas; J. Grisolia; L. Ressier; A. Arbouet; V. Paillard et al.
Physica Status Solidi (a). 2007. Vol. 204, num. 2, p. 487 – 491. DOI : 10.1002/pssa.200673232.K. Ehrmann; K. Pataky; M. Stettler; F. M. Wurm; J. Brugger et al.
Lab on a Chip. 2007. Vol. 7, num. 3, p. 381 – 383. DOI : 10.1039/B613240E.M. Lishchynska; V. Bourenkov; M. A. F. van den Boogaart; L. Doeswijk; J. Brugger et al.
Microelectronic Engineering. 2007. Vol. 81, num. 1, p. 42 – 53. DOI : 10.1016/j.mee.2006.08.003.B. Viallet; L. Ressier; J. Grisolia; J. Peyrade; R. Podgajny et al.
physica status solidi (c). 2007. Vol. 4, num. 2, p. 276 – 278. DOI : 10.1002/pssc.200673344.R. S. Wiederkehr; M. C. Salvadori; J. Brugger; F. T. Degasperi; M. Cattani
Smart Materials and Structures. 2007. Vol. 16, p. 2302 – 2307. DOI : 10.1088/0964-1726/16/6/033.C. W. Park; O. Vazquez Mena; J. Brugger
Nanotechnology. 2007. Vol. 18, num. 4, p. 044002. DOI : 10.1088/0957-4484/18/4/044002.M. Jenke; C. Schreiter; G. Kim; H. Vogel; J. Brugger
Microfluidics and Nanofluidics. 2007. Vol. 3, num. 2, p. 189 – 194. DOI : 10.1007/s10404-006-0119-2.K. Lee; M. Duchamp; G. Kulik; A. Magrez; J. W. Seo et al.
Applied Physics Letters. 2007. Vol. 91, num. 17, p. 173112. DOI : 10.1063/1.2803320.J. Arcamone; A. Sanchez-Amores; J. Montserrat; M. van den Boogaart; J. Brugger et al.
Journal of Microlithography, Microfabrication, and Microsystems. 2007. Vol. 6, p. 013005 – 1. DOI : 10.1117/1.2435273.C. Ingrosso; V. Fakhfouri; M. Striccoli; A. Agostiano; A. Voigt et al.
Advanced Functional Materials. 2007. Vol. 17, p. 2009 – 2017. DOI : 10.1002/adfm.200700098.K. W. Eberhardt; S. Mouaziz; G. Boero; J. Brugger; B. H. Meier
Physics Review Letters. 2007. Vol. 99, p. 227603. DOI : 10.1103/PhysRevLett.99.227603.H. Guo; D. Martrou; T. Zambelli; J. Polesel-Maris; A. Piednoir et al.
Virtual Journal of Nanoscale Science & Technology. 2007. Vol. 15, num. 10.E. A. Speets; P. te Riele; M. A. F. van den Boogaart; L. M. Doeswijk; B. J. Ravoo et al.
Advanced Functional Materials. 2006. Vol. 16, num. 10, p. 1337 – 1342. DOI : 10.1002/adfm.200500933.J. A. J. Steen; J. Hayakawa; T. Harada; K. Lee; F. Calame et al.
Nanotechnology. 2006. Vol. 17, num. 5, p. 1464 – 1469. DOI : 10.1088/0957-4484/17/5/050.A. Fraile Rodriguez; L. J. Heyderman; F. Nolting; A. Hoffmann; J. E. Pearson et al.
Applied Physics Letters. 2006. Vol. 89, num. 14, p. 142508. DOI : 10.1063/1.2357007.S. Mouaziz; G. Boero; G. Moresi; C. Degen; Q. Lin et al.
Microelectronic Engineering. 2006. Vol. 83, num. 4-9, p. 1306 – 1308. DOI : 10.1016/j.mee.2006.01.218.S. Krishnamoorthy; R. Pugin; J. Brugger; H. Heinzelmann; A. C. Hoogerwerf et al.
Langmuir. 2006. Vol. 22, num. 8, p. 3450 – 3452. DOI : 10.1021/la052299a.V. Fakhfouri; S. Jiguet; J. Brugger
Advances in Science and Technology. 2006. Vol. 45, p. 1293 – 1298. DOI : 10.4028/www.scientific.net/AST.45.1293.C. Danelon; C. Santschi; J. Brugger; H. Vogel
Langmuir. 2006. Vol. 22, num. 25, p. 10711 – 10715. DOI : 10.1021/la061321c.A. Arbouet; M. Carrada; F. Demangeot; V. Paillard; G. BenAssayag et al.
Journal of Luminescence. 2006. Vol. 121, num. 2, p. 340 – 343. DOI : 10.1016/j.jlumin.2006.08.070.C. Danelon; M. Jenke; C. Schreiter; G. Kim; J-B. Perez et al.
Chimia. 2006. Vol. 60, num. 11, p. 754 – 760. DOI : 10.2533/chimia.2006.754.C. Danelon; J-B. Perez; C. Santschi; J. Brugger; H. Vogel
Langmuir. 2006. Vol. 22, num. 1, p. 22 – 25. DOI : 10.1021/la052387v.S. Krishnamoorthy; R. Pugin; J. Brugger; H. Heinzelmann; C. Hinderling
Advanced Functional Materials. 2006. Vol. 16, num. 11, p. 1469 – 1475. DOI : 10.1002/adfm.200500524.M. A. F. van den Boogaart; M. Lishchynska; L. M. Doeswijk; J. C. Greer; J. Brugger
Sensors and Actuators A. 2006. Vol. 130-131, p. 568 – 574. DOI : 10.1016/j.sna.2005.08.037.S. Mouaziz; G. Boero; R. S. Popovic; J. Brugger
IEEE Journal of Microelectromechanical Systems. 2006. Vol. 15, num. 4, p. 890 – 895. DOI : 10.1109/JMEMS.2006.879376.N. Takano; L. M. Doeswijk; M. A. F. van den Boogaart; J. Auerswald; H. F. Knapp et al.
Journal of Micromechanics and Microengineering. 2006. Vol. 16, num. 8, p. 1606 – 1613. DOI : 10.1088/0960-1317/16/8/023.M. A. F. van den Boogaart; L. M. Doeswijk; J. Brugger
IEEE Journal of Microelectromechanical Systems. 2006. Vol. 15, num. 6, p. 1663 – 1670. DOI : 10.1109/JMEMS.2006.885981.C. W. Park; O. Vazquez Mena; M. A. F. van den Boogaart; J. Brugger
Journal of Vacuum Science and Technology B. 2006. Vol. 24, num. 6, p. 2772 – 2775. DOI : 10.1116/1.2366610.C. Santschi; M. Jenke; P. Hoffmann; J. Brugger
Nanotechnology. 2006. Vol. 17, num. 11, p. 2722 – 2729. DOI : 10.1088/0957-4484/17/11/002.G. Boero; S. Rusponi; P. Bencok; R. S. Popovic; H. Brune et al.
Applied Physics Letters. 2005. Vol. 87, num. 15, p. 1 – 3. DOI : 10.1063/1.2089180.V. A. Savu; C. M. Wilson; L. Fruzio; D. E. Prober; R. J. Schoelkopf
IEEE Transactions on Applied Superconductivity. 2005. Vol. 15, num. 2, p. 609 – 612. DOI : 10.1109/TASC.2005.849956.C. Cojocaru; C. Harnagea; F. Rosei; A. Pignolet; M. van den Boogaart et al.
Applied Physics Letters. 2005. Vol. 86, num. 18, p. 183107 (3 pages). DOI : 10.1063/1.1923764.A. Ludwig; J. Cao; J. Brugger; I. Takeuchi
Measurement Science and Technology. 2005. Vol. 16, num. 1, p. 111 – 118. DOI : 10.1088/0957-0233/16/1/015.G. Boero; I. Utke; T. Bret; N. Quack; M. Todorova et al.
Applied Physics Letters. 2005. Vol. 86, num. 4, p. 042503 (3 pages). DOI : 10.1063/1.1856134.G. Boero; I. Utke; T. Bret; N. Quack; M. Todorova et al.
Virtual Journal of Nanoscale Science & Technology. 2005. Vol. 86, p. 042503.M. Hopcroft; T. Kramer; G. Kim; K. Takashima; Y. Higo et al.
Fatigue and Fracture of Engineering Materials and Structures. 2005. Vol. 28, num. 8, p. 735 – 742. DOI : 10.1111/j.1460-2695.2005.00873.x.S. Keller; S. Mouaziz; G. Boero; J. Brugger
Virtual Journal of Nanoscale Science & Technology. 2005. Vol. 12, num. 26.S. Keller; S. Mouaziz; G. Boero; J. Brugger
Review of Scientific Instruments. 2005. Vol. 76, num. 12, p. 125102 (4 pages). DOI : 10.1063/1.2140443.T. M. Ito; T. Averett; D. Barkhuff; G. Batigne; D. H. Beck et al.
Physical Review Letters. 2004. Vol. 92, num. 10, p. 102003. DOI : 10.1103/PhysRevLett.92.102003.V. Savu; L. Li; A. Mukherjee; C. M. Wilson; L. Frunzio et al.
Nuclear Instruments and Methods in Physics Research A. 2004. Vol. 520, num. 1-3, p. 237 – 239. DOI : 10.1016/j.nima.2003.11.332.J. Hayakawa; K. Ito; M. Fujimori; S. Heike; T. Hashizume et al.
Journal of Applied Physics. 2004. Vol. 96, num. 6, p. 3440 – 3442. DOI : 10.1063/1.1769605.A. Meister; M. Liley; J. Brugger; R. Pugin; H. Heinzelmann
Applied Physics Letters. 2004. Vol. 85, num. 25, p. 6260 – 6262. DOI : 10.1063/1.1842352.M. A. F. van den Boogaart; G. M. Kim; R. Pellens; J. P. van den Heuvel; J. Brugger
Virtual Journal of Biological Physics Research. 2004. Vol. 8, num. 12.M. van den Boogaart; G. Kim; R. Pellens; J. van den Heuvel; J. Brugger
Journal of Vacuum Science and Technology B. 2004. Vol. 22, num. 6, p. 3174 – 3177. DOI : 10.1116/1.1802931.F. Vroegindeweij; E. Speets; J. Steen; J. Brugger; D. Blank
Applied Physics A – Mater. Sci. Process.. 2004. Vol. 79, num. 4-6, p. 743 – 745. DOI : 10.1007/s00339-004-2749-0.A. Kis; G. Csanyi; J. P. Salvetat; T. N. Lee; E. Couteau et al.
Nature Materials. 2004. Vol. 3, num. 3, p. 153 – 157. DOI : 10.1038/nmat1076.G. Kim; S. Kawai; M. Nagashio; H. Kawakatsu; J. Brugger
Journal of Vacuum Science and Technology B. 2004. Vol. 22, num. 4, p. 1658 – 1661. DOI : 10.1116/1.1761240.C. Massin; F. Vincent; A. Homsy; K. Ehrmann; G. Boero et al.
Journal of Magnetic Resonance. 2003. Vol. 164, num. 2, p. 242 – 255. DOI : 10.1016/S1090-7807(03)00151-4.G. Boero; M. Demierre; P. Besse; R. Popovic
SENSORS AND ACTUATORS A-PHYSICAL. 2003. Vol. 106, num. 1-3, p. 314 – 320. DOI : 10.1016/S0924-4247(03)00192-4.N. R. Tas; P. Mela; T. Kramer; J. W. Berenschot; A. van den Berg
Nano Letters. 2003. Vol. 3, num. 11, p. 1537 – 1540. DOI : 10.1021/nl034676e.G. Boero; M. Bouterfas; C. Massin; F. Vincent; P. Besse et al.
Review of Scientific Instruments. 2003. Vol. 74, num. 11, p. 4794 – 4798. DOI : 10.1063/1.1621064.G. Kim; B. Kim; E. Ten Have; F. Segerink; N. Van Hulst et al.
Journal of Microscopy. 2003. Vol. 209, num. 3, p. 267 – 271. DOI : 10.1046/j.1365-2818.2003.01134.x.G. Kim; M. van den Boogaart; J. Brugger
Microelectronic Engineering. 2003. Vol. 67-68, p. 609 – 614. DOI : 10.1016/S0167-9317(03)00121-7.M. Koelbel; R. W. Tjerkstra; G. M. Kim; J. Brugger; C. J. M. van Rijn et al.
Advanced Functional Materials. 2003. Vol. 13, num. 3, p. 219 – 224. DOI : 10.1002/adfm.200390033.G. M. Kim; B. J. Kim; J. Brugger
Sensors and Actuators A. 2003. Vol. 107, num. 2, p. 132 – 136. DOI : 10.1016/S0924-4247(03)00298-X.P. Ekkels; R. Tjerkstra; G. Krijnen; J. Berenschot; J. Brugger et al.
Microelectronic Engineering. 2003. Vol. 67-8, p. 422 – 429. DOI : 10.1016/S0167-9317(03)00098-4.P-A. Besse; G. Boero; M. Demierre; V. Pott; R. Popovic
Applied Physics Letters. 2002. Vol. 80, num. 22, p. 4199 – 4201. DOI : 10.1063/1.1483909.C. Massin; G. Boero; F. Vincent; J. Abenhaim; P-A. Besse et al.
Sensors and Actuators, A: Physical. 2002. Vol. 97-98, p. 280 – 288. DOI : 10.1016/S0924-4247(01)00847-0.M. Kolbel; R. Tjerkstra; J. Brugger; C. van Rijn; W. Nijdam et al.
Nano Letters. 2002. Vol. 2, num. 12, p. 1339 – 1343. DOI : 10.1021/nl025784o.G. Kim; A. Kovalgin; J. Holleman; J. Brugger
Journal of Nanoscience and Nanotechnology. 2002. Vol. 2, num. 1, p. 55 – 59. DOI : 10.1166/jnn.2002.073.V. Bucher; J. Brugger; D. Kern; G. M. Kim; M. Schubert et al.
Microelectronic Engineering. 2002. Vol. 61–62, p. 971 – 980. DOI : 10.1016/S0167-9317(02)00422-7.G. M. Kim; B. J. Kim; M. Liebau; J. Huskens; D. N. Reinhoudt et al.
IEEE Journal of Microelectromechanical Systems. 2002. Vol. 11, num. 3, p. 175 – 181. DOI : 10.1109/JMEMS.2002.1007395.S. P. Wells; T. Averett; D. Barkhuff; D. H. Beck; E. J. Beise et al.
PHYSICAL REVIEW C. 2001. Vol. 63, num. 6, p. 064001. DOI : 10.1103/PhysRevC.63.064001.G. Boero; J. Frounchi; B. Furrer; P. Besse; R. Popovic
Review of Scientific Instruments. 2001. Vol. 72, num. 6, p. 2764 – 2768. DOI : 10.1063/1.1374599.G. Boero; P. Besse; R. Popovic
Applied Physics Letters. 2001. Vol. 79, num. 10, p. 1498 – 1500. DOI : 10.1063/1.1399306.B. J. Kim; M. Liebau; J. Huskens; D. N. Reinhoudt; J. Brugger
Microelectronic Engineering. 2001. Vol. 57-58, p. 755 – 760. DOI : 10.1016/S0167-9317(01)00469-5.B. J. Kim; J. W. Flamma; E. S. ten Have; M. F. Garcia-Parajo; N. F. van Hulst et al.
Journal of Microscopy. 2001. Vol. 202, num. 1, p. 16 – 21. DOI : 10.1046/j.1365-2818.2001.00820.x.C. Rusu; R. van’t Oever; M. de Boer; H. Jansen; E. Berenschot et al.
IEEE Journal of Microelectromechanical Systems. 2001. Vol. 10, num. 2, p. 238 – 246. DOI : 10.1109/84.925758.D. T. Spayde; T. Averett; D. Barkhuff; D. H. Beck; E. J. Beise et al.
Physical Review Letters. 2000. Vol. 84, num. 6, p. 1106 – 1109. DOI : 10.1103/PhysRevLett.84.1106.R. Hasty; A. M. Hawthorne-Allen; T. Averett; D. Barkhuff; D. H. Beck et al.
SCIENCE. 2000. Vol. 290, num. 5499, p. 2117 – 2119. DOI : 10.1126/science.290.5499.2117.P. Besse; C. Schott; G. Boero; F. Borger; R. Popovic
Measurement and Control. 2000. Vol. 33, num. 9, p. 261 – 264. DOI : 10.1177/002029400003300902.D. Allspach; A. Hahn; C. Kendziora; S. Pordes; G. Boero et al.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1998. Vol. 410, num. 2, p. 195 – 205. DOI : 10.1016/S0168-9002(98)00236-8.G. Boero; C. de Raad Iseli; P. Besse; R. Popovic
SENSORS AND ACTUATORS A-PHYSICAL. 1998. Vol. 67, num. 1-3, p. 18 – 23. DOI : 10.1016/S0924-4247(97)01722-6.M. Willemin; C. Rossel; J. Brugger; M. Despont; H. Rothuizen et al.
Journal of Applied Physics. 1998. Vol. 83, num. 3, p. 1163. DOI : 10.1063/1.366811.T. Akiyama; A. Tonin; H. Hidber; J. Brugger; P. Vettiger et al.
Sensors and Actuators A. 1998. Vol. 64, num. 1, p. 1 – 6. DOI : 10.1016/S0924-4247(98)80051-4.H. Lorenz; M. Despont; N. Fahrni; J. Brugger; P. Vettiger et al.
Sensors and Actuators A: physical. 1998. Vol. 64, num. 1, p. 33 – 39. DOI : 10.1016/S0924-4247(98)80055-1.J. Brugger; G. Beljakovic; M. Despont; H. Biebuyck; N. F. de Rooij et al.
Sensors and Actuators A. 1998. Vol. 70, num. 1-2, p. 191 – 194. DOI : 10.1016/S0924-4247(98)00132-0.H. P. Lang; R. Berger; F. Battiston; J. P. Ramseyer; E. Meyer et al.
Appl. Phys. A. 1998. Vol. 66, num. 7, p. S61 – S64. DOI : 10.1007/s003390051100.H. P. Lang; R. Berger; A. Andreoli; J. Brugger; M. Despont et al.
Applied Physics Letters. 1998. Vol. 72, num. (3), p. 383 – 385. DOI : 10.1063/1.120749.G. Boero; W. Kubischta; P. Leprince
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1997. Vol. 398, num. 2-3, p. 157 – 161. DOI : 10.1016/S0168-9002(97)00823-1.G. Baur; G. Boero; S. Brauksiepe; A. Buzzo; W. Eyrich et al.
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1997. Vol. 391, num. 1, p. 201 – 204. DOI : 10.1016/S0168-9002(96)01197-7.W. Oelert; G. Baur; G. Boero; S. Brauksiepe; A. Buzzo et al.
Hyperfine Interactions. 1997. Vol. 109, num. 1-4, p. 191 – 203. DOI : 10.1023/A:1012609601849.J. Brugger; G. Beljakovic; M. Despont; N. F. de Rooij; P. Vettiger
Microeleetronic Engineering. 1997. Vol. 35, p. 401 – 404. DOI : 10.1016/S0167-9317(96)00210-9.G. Boero; M. Lovetere; M. Macrí; S. Passaggio; A. Pozzo
Nuovo Cimento della Societa Italiana di Fisica A. 1996. Vol. 109, num. 11, p. 1581 – 1590. DOI : 10.1007/BF02778241.G. Baur; G. Boero; A. Brauksiepe; A. Buzzo; W. Eyrich et al.
Physics Letters B. 1996. Vol. 368, num. 3, p. 251 – 258. DOI : 10.1016/0370-2693(96)00005-6.N. Blanc; J. Brugger; N. F. de Rooij; U. Duerig
Journal of Vacuum Science & Technology B. 1996. Vol. 14, num. 2, p. 901 – 905. DOI : 10.1116/1.589171.P-F. Indermühle; V. P. Jaecklin; J. Brugger; C. Linder; N. F. de Rooij et al.
Sensors and Actuators A. 1995. Vol. 46-47, p. 562 – 565. DOI : 10.1016/0924-4247(94)00962-H.V. P. Jaecklin; C. Linder; J. Brugger; N. F. de Rooij; J. M. Moret et al.
Sensors and Actuators A. 1994. Vol. 43, num. 1-3, p. 296 – 274. DOI : 10.1016/0924-4247(93)00699-5.J. Brugger; N. Blanc; P. Renaud; N. F. de Rooij
Sensors and Actuators A. 1994. Vol. 43, num. 1-3, p. 339 – 345. DOI : 10.1016/0924-4247(93)00701-5.P. F. Indermuehle; C. Linder; J. Brugger; V. P. Jaecklin; N. F. de Rooij
Sensors and Actuators A. 1994. Vol. 43, num. 1-3, p. 346 – 350. DOI : 10.1016/0924-4247(93)00704-8.J. Brugger; V. P. Jaecklin; C. Linder; N. Blanc; P. F. Indermühle et al.
Journal of Micromechanics and Microengineering. 1993. Vol. 3, num. 4, p. 161 – 167. DOI : 10.1088/0960-1317/3/4/001.R. A. Buser; J. Brugger; N. F. de Rooij
Ultramicroscopy. 1992. Vol. 42-44, p. 1476 – 1480. DOI : 10.1016/0304-3991(92)90469-Z.J. Brugger; R. A. Buser; N. F. de Rooij
Journal of Micromechanics and Microengineering. 1992. Vol. 2, p. 218 – 220. DOI : 10.1088/0960-1317/2/3/026.J. Brugger; R. A. Buser; N. F. de Rooij
Sensors and Actuators A. 1992. Vol. 34, num. 3, p. 193 – 200. DOI : 10.1016/0924-4247(92)85002-J.R. Buser; J. Brugger; N. de Rooij
Microelectronic Engineering. 1991. Vol. 15, num. 1-4, p. 407 – 410. DOI : 10.1016/0167-9317(91)90252-9.