Thin films and surface topography

There are two AFMs available in the MHMC platform; a Cypher VRS, located in MXG 923, and a NanoScope IIIa microscope, located in MXG 922.

If you want to use them, please contact Mr. Philippe Charpilloz for a training.

 

Multimode AFM, Nanoscope IIIa:

Specifications:

  • Lateral range of scanning area: ~110μm x 110μm x 10μm (depending on the scanner)
  • Maximum sample size: 15mm diameter, 5mm thickness
  • Resolution:μm to Angstrom
  • Liquid cell: experiments can be carried out in water, solvents and buffers
  • Temperature range = -35°C – 250°C

Cypher VRS, Oxford Instrument

Specifications:

  • Lateral range of scanning area: ~30μm x 30μm
  • Maximum sample size: 50mm x 50mm x 20mm
  • Resolution: μm to Angstrom
  • Photo-thermal (Blue drive) excitation
  • Liquid cell
  • Heating/cooling stage

 

The ellipsometer is a SE-2000 from Semilab. It is located in MXC 905.

If you want to use it, please contact  Mr. Yann Lavanchy for a training.

Specifications of the instrument:

  •  Microspots
  •  Detectors: UV-Vis
  • CCD camera
  • Automated moving stage
  • Liquid Cell