Welcome to the Electron Spectrometry and Microscopy Laboratory (LSME). In this laboratory we address scientific problems through the development and utilization of advanced electron microscopy techniques and data processing and interpretation. Current research interests include:
– Improved elemental quantification in analytical scanning transmission electron microscopy using combined EDXS and EELS.
– 3D reconstruction of curvilinear and other objects via “single shot” data acquisition in STEM and algorithmic reconstruction for fast/low dose applications in materials and life sciences.
– Open science and “Big data” in electron microscopy: strategies for open source exporting, management and processing of hyperspectral data created by new generation spectroscopy detectors.
– Characterization of structure and structural evolution in energy technology materials (fuel cells and transparent conductive oxide layers for photovoltaic cells).
– Precision measurements of crystalline structure and electronic properties from the atomic to nano scales by aberration corrected microscopy and spectroscopy.
– Measuring near field optical properties of nanophotonic and plasmonic structures using high energy resolution low loss EELS (e.g. Au-Fe “magnetoplasmonic” nanoparticles).
Welcoming two new collaborators!
This November, we were pleased to have two new collaborators join the LSME team.During his studies of applied physics and renewable energy studies, Sebastian Cozma discovered a deep interest in microstructure characterization and analytical techniques. To pursue this interest, Sebastian is beginning a Ph.D. with Prof. Cécile Hébert on segmentation and quantification of STEM EDX (…)
New in ACS Nano: EELS mapping of dielectric photonic nanocavities
In a new article published in ACS Nano, working with Dr Valentin Flauraud and Dr Frank Demming-Janssen, LSME scientist Dr Duncan Alexander uses advanced electron spectroscopy and finite element simulations to analyse the spatial and spectral signatures of different optical excitations supported in patterned silicon photonic nanocavities. By sampling nanocavities of different shapes and sizes, (…)
New in Acta Materialia: growth of grain triplets in ZnO thin films
Just published in Acta Materialia, using the detailed analysis of transmission electron microscopy (TEM) data, researchers from the LSME identify a novel growth mechanism of grain triplets in polycrystalline thin films of ZnO. The study primarily depends on the mining of data acquired using automated crystal orientation mapping with scanning nanobeam electron diffraction, which is (…)