- Description
- Lyncee Tec
Characterization MEMS motion up to 20MHz at full frame - Condition of use
- Contact the Instrument Manager
- Instrument Manager
- Danick Briand
- Owner
- LMTS
- Description
- The Hirox KH-8700 base station comes with a full high definition LCD monitor with a high intensity LED source and a high sensitivity compact CCD camera The stand has a motorized z-stage and also a motorized x-y stage is available
2 lenses available:
MXG-2500REZ
dual illumination revolver zoom lens (35-2500 x)
bright field /darkfield illumination
polarisation filter
MX(G)-5040RZ(SZ)
mid range zoom lens (50-400x)
with selection of optical adapter
extreme long working distance (6-7 cm)
rotary head adapte allow 360° 3D image observation - Condition of use
- Only trained people can use this microscope. Please contact the instrument manager if you would like to be trained
- Instrument manager
- Babak Mazinani — People – EPFL
- Place
- MC B4 204
- Owner
- IMT-GE
- Description
- Voltage: 0.02 – 30 keV
Intensity: 6 pA – 100 nA
Resolution: 1nm
Equipped with EDS, EBSD, EBIC and a 20-1000°C heating plate. - Condition of use
- Only trained people can access the SEM. Please contact the managers if you would like to be trained.
Sharing:
LMTM: Monday, Wednesday, Friday
PVLAB: Thursday
Other labs: Tuesday; CHF 50.-/hour
Booking:
https://reservations.epfl.ch/cgi-bin/res?login=1 - Instrument managers
- Cyril Cayron
Aïcha Hessler-Wyser - Place
- MC B4 202
- Owner
- LMTM
- Description
- JEOL JSM-7500 TFE
Resolution: 1.5 nm @ 20 keV, 3 nm @ 1 keV
Maximum sample size: 4” wafer
SEM equiped with EDS and EBSD - Condition of use
- Only trained people can access the SEM. Please contact the instrument manager if you would like to be trained.
Fee (for EPFL labs only):
CHF 31/hour.
Booking:
https://reservations.epfl.ch/cgi-bin/res - Instrument manager
- Daniel Jacobs
- Place
- MC B4 204
- Owner
- IMT-GE
Keyence VK X-1000 is a laser confocal microscope that works by combining white light with a laser light source in order to scan a surface and collect both an optical image and high-resolution topography data. Nanometre-level surface features can be measured by analyzing the intensity of the returned laser light relative to the z-position of the laser.
Conditions of Use:
The laser confocal microscope is situated in office MC B4 202 and can be shared with people through the EPFL reservation system.
Only trained people can use this equipment.
For more details, please contact:
Instrument Manager: Sanjay Manoharan