X-ray world record: Looking inside a microchip with 4 nm precision
— In a collaboration with EPFL Lausanne, ETH Zurich and the University of Southern California researchers at the Paul Scherrer Institute PSI have used X-rays to look inside a microchip with higher precision than ever before. The image resolution of 4 nanometres marks a new world record. The high-resolution three-dimensional images of the type they produced will enable advances in both information technology and the life sciences. The researchers are reporting their findings in the current issue of the journal Nature.
