7 to 10 November, 2022
ETH Zürich, Hönggerberg
This course focuses on morphological and analytical techniques for complex studies of structural and functional materials using electrons, photons and ions. The lectures are accompanied by prolonged instrument visits and on-line demonstrations using real-life specimens to deepen the gained knowledge.
The lectures will cover the fundamentals and required background knowledge and also present the most typical challenges for material characterization on atomic, nano-, micro-, and millimeter scales. Each lecture will give real-life examples from the speakers’ own experiences or those from literature and will describe the advantages, limitations and opportunities related to the methods discussed.
The course also features a particular focus on the importance of the sample preparation routines optimizing resolution, sensitivity and the accuracy of each method.
Location
ETHZ Hönggerberg. Details TBA.
Registration
Registration is available through this link.
Please note that payment is now required upon registration using the PayOnLine platform, which accepts major credit cards, PayPal and Twint. Course fees being paid directly by an EPFL laboratory may be paid by account transfer – please contact Carey Sargent if you are an EPFL student and prefer this method of payment.
Tuition, lunches and coffee breaks are included in the fees.
PhD students from EPFL, ETH Zurich, PSI, Empa and CSEM: CHF 480.-
PhD students from other institutions and other academic participants: CHF 780.-
All other participants: CHF 2,000.-
Topics
Fundamentals of TEM/STEM imaging
Analytical Electron Microscopy (EELS and EFTEM)
Electron Diffraction in TEM
Microstructure and Phase Analyses in TEM
TEM Image Simulations
In-situ EM
Analytical SEM (EDX and EBSD)
Focused Ion Beam Fundamentals and Applications
Introduction to Secondary Ion Mass Spectrometry
Atom Probe Tomography
XRD in Material Science
Raman Spectroscopy as Characterization of Semi-conductor Materials
Analytical Optical Spectroscopy & Microscopy
Fundamentals of Atomic Force Microscopy
Instrument Visits – Details TBC
The course will include visits to eight instruments. Information on the various instrument visits is available below:
Station 1 X-ray diffraction
Station 2 Scanning Electron Microscopy
Station 3 Focused Ion Beam
Station 4 Raman
Station 5 Atom Probe
Station 6 In-situ EM/ Scanning TEM
Station 7 CTEM and analytical STEM
Station 8 High-resolution TEM simulations
Who should attend
The course target audience is PhD and Master students, industrial and academic researchers.
The number of participants is limited to a maximum of 32.
This course may be validated for 2 ECTS credits in the doctoral program of EPFL and ETH Zurich after acceptance by the corresponding institution. In this case, full attendance and a final examination after the end of the course on the final day is required. Please contact Carey Sargent for details.
Accommodation
Travel and accommodation should be reserved and paid for by the participants.
Contact Information
Carey Sargent
Phone: +41 21 693 46 56