7 to 10 November, 2022
ETH Zürich, Hönggerberg
Material Characterization is an indispensable part of any technological development and any research. The fabrication of new materials, the optimization of the existing solutions to specific purposes, the material failure analyses, etc. – all these rely on the establishing and understanding of the intrinsic interconnection between the material build-up and its performance.
The large body of material characterization techniques uses radiation as a tool. The laboratory instruments and the large-scale facilities such as a synchrotron employ electrons, neutrons, x-rays or ions to irradiate a specimen and analyze the outcome. Elastic and inelastic interactions of radiation and the matter result in scattering of primary radiation or generation of secondary signals. The resolute detection and understanding of the nature of events are fundamental for the instrumentation, the usage and, most importantly, for data interpretation.
The main goal of this course is, therefore, to present the bulk of the information on radiation-based techniques regularly employed for material characterization in physics, material science and technology. The course is composed of lectures and demonstrations on the instruments given by experts in the field. Electron microscopy in all its richness of methods (TEM, STEM, SEM, in-situ-TEM, cryo-TEM, etc.), Auger Spectroscopy, X-ray and Raman scattering, Optical Spectroscopy and Microscopy, Mass-Spectroscopy and Atom Probe Tomography, Secondary Ion Mass-Spectrometry – are techniques presented at the course.
The fundamentals, workflow, limitations, and advantages of each technique over a possible alternative are supported by extensive information on the specimen preparation routines that ensure the reliability of a corresponding data set. The complexity of data evaluation routes, the available solutions and open-source algorithms are presented in the lectures and demonstrated during the instrumental visits.
Advanced, most up-to-date experimental developments in each field are presented and discussed during the course. The lecturers and the instrument visit scientists are open to discussions on your specific scientific questions and welcome you to contact them also after the course with your scientific needs.
Location
ETHZ Hönggerberg. Details TBA.
Registration
Registration is available through this link.
Please note that payment is now required upon registration using the PayOnLine platform, which accepts major credit cards, PayPal and Twint. Course fees being paid directly by an EPFL laboratory may be paid by account transfer – please contact Carey Sargent if you are an EPFL student and prefer this method of payment.
Tuition, lunches and coffee breaks are included in the fees.
PhD students from EPFL, ETH Zurich, PSI, Empa and CSEM: CHF 480.-
PhD students from other institutions and other academic participants: CHF 780.-
All other participants: CHF 2,000.-
Topics
Fundamentals of TEM/STEM imaging
Analytical Electron Microscopy (EELS and EFTEM)
Electron Diffraction in TEM
Microstructure and Phase Analyses in TEM
TEM Image Simulations
In-situ EM
Analytical SEM (EDX and EBSD)
Focused Ion Beam Fundamentals and Applications
Introduction to Secondary Ion Mass Spectrometry
Atom Probe Tomography
XRD in Material Science
Raman Spectroscopy as Characterization of Semi-conductor Materials
Analytical Optical Spectroscopy & Microscopy
Fundamentals of Atomic Force Microscopy
Instrument Visits – Details TBC
The course will include visits to eight instruments. Information on the various instrument visits is available below:
Station 1 X-ray diffraction
Station 2 Scanning Electron Microscopy
Station 3 Focused Ion Beam
Station 4 Raman
Station 5 Atom Probe
Station 6 In-situ EM/ Scanning TEM
Station 7 CTEM and analytical STEM
Station 8 High-resolution TEM simulations
Who should attend
The course target audience is PhD and Master students, industrial and academic researchers.
The number of participants is limited to a maximum of 32.
This course may be validated for 2 ECTS credits in the doctoral program of EPFL and ETH Zurich after acceptance by the corresponding institution. In this case, full attendance and a final examination after the end of the course on the final day is required. Please contact Carey Sargent for details.
Accommodation
Travel and accommodation should be reserved and paid for by the participants.
Contact Information
Carey Sargent
Phone: +41 21 693 46 56