| X ray source type | Open, Transmission |
| Voltage, min (kV) – max (kV) | 20 – 160 with continuous variation |
| Spot size | 5 µm |
| Filter | Al, Cu |
| Imaging sensor | Amorphous Silicium Flat Panel, CsI scintillator |
| Nb of pixels (X, Y) and pixel size | 2560 x 2048 pixel, 124 µm pitch |
| Detector size | 320 x 250 mm |
| Grey levels (bit) | 16 bits |
| Frame rate (fast acquisition) | Up to 22/44/88 FPS respectively in binning 1/2/4 |
| Frame rate (high resolution acquisition) | 22 FPS in full resolution |
| Spatial resolution | 0.4 µm |
| Sample handling / axis | 6 linear, 1 rotation on compressed air bearing |
| Rotation speed & angular resolution | 30 rpm, 5.7*10-4° |
| Temperature control | By environmental conditions in the lab |
| ESD protection (for sample) | Sample stage is grounded |
| Vibration protection type | Granit structure and compressed air damping |
| Max. scanable dimensions & sample height | 700 mm / 385 mm |
| Max. scanable dimension & sample diameter | 350 mm / 240 mm |
| Max. weight of sample | 20 kg |
| Control & acquisition system + reconstruction | Two PC with Windows 10 Pro 64 bits |
| Control system & Reconstruction | X-Act, with possibility to do offline processing |
| Measurement | Point to point, not certified |
| Export | X-Act: export stl, volume raw & slices series |
