PIXE Platform

3D Non-Destructive X-Ray Analysis of Materials Microstructures
Photo of PIXE CT-scanner © 2021 EPFL

CT-scan rendering of interior of a feather © 2021 PIXE EPFL

ENAC Interdisciplinary Platform for X-ray micro-tomography (PIXE)

The PIXE platform is designed to perform very high resolution imaging on natural or engineered materials. It provides researchers and students with non-destructive quantitative data on the internal density contrasts and structures of their studied materials.

This micro CT system currently has no equivalent in Switzerland. Due to its dimensions, spatial resolution, ability to accept various samples geometries, it is specially adapted to the field of engineering.

Its technical characteristics make it possible to offer multiple measurement possibilities on materials of various sizes and types.

PIXE is also developing interdisciplinary scientific collaborations in the field of materials imaging between the various EPFL units and those of other schools or industries.

For further information, please contact: [email protected]