Tuesday 24 November – SEM: Instrumentation, imaging and elemental analyses
9:00 SEM: mode of operation – Dr. Johann Michler, Empa
10:30 SEM: Image formation and interpretation – Dr. Johann Michler, Empa
12:00 Lunch break
13:00 Elemental analyses with EDS – Dr. Xavier Maeder, Empa
15:00 Elemental analyses with WDS and µ-XRF – Dr. Xavier Maeder, Empa
16:00 Introduction to Auger Electron Spectroscopy (AES) – Dr. Xavier Maeder, Empa
17:00 Demonstration at the SEM for EDS analyses –Dr. Xavier Maeder, Empa
17.30 End
Wednesday 25 November – SEM microstructural characterization
9:00 Introduction to ECCI – Dr. Xavier Maeder, Empa
10:00 Introduction to EBSD – Dr. Xavier Maeder, Empa
12.00 Lunch break
13.00 EBSD techniques: Texture, advanced EBSD analyses – Dr. Xavier Maeder, Empa
15.30 Advanced EBSD techniques: 3D-EBSD, TKD, HR-EBSD – Dr. Xavier Maeder, Empa
17:00 Demonstration at the SEM for EBSD analyses – Dr. Xavier Maeder, Empa
17.30 End
Thursday 26 November – TEM: imaging and spectroscopy techniques and introduction to APT
9:00 Introduction to TEM: imaging and diffraction – Dr. Xavier Maeder, Empa
10:30 TEM spectroscopy: EDS, EELS – Dr. Xavier Maeder, Empa
12.00 Lunch break
13:00 TEM advanced diffraction techniques, 4D-STEM – Dr. Xavier Maeder, Empa
14:00 Introduction to Atom Probe Tomography – Dr. Barbara Putz, Empa
17:00 Demonstration at the TEM and the APT – Dr. Xavier Maeder, Dr. Barbara Putz, Empa
17:30 End
Friday 27 November – FIB: Fabrication and spectroscopy and advanced FIB-SEM combinatorial analyses
9:00 FIB: Milling and Fabrication – Dr. Lorenz Herrmann, Empa
11:00 Elemental analyses with FIB-TOFSIMS – Dr. Lorenz Herrmann, Empa
12:00 Lunch break
13:00 In situ testing in SEM and advanced combinatorial analyses – Dr. Xavier Maeder, Dr. Johann Michler Empa
16:00 Written Exam
17:30 End