24 November – 27 November, 2026, Empa Thun
REGISTRATION DEADLINE FRIDAY, 13 NOVEMBER
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work. This course may be validated for 2 ECTS credits in the doctoral programs of EPFL and ETH Zurich, after acceptance by the corresponding institution. In this case, students will need to attend every lecture and pass a final written examination.
Registration and participation fees
This course is open to participants with a basic background in materials science, mechanical engineering, chemical engineering, micro-technology or physics. It is taught in English and is limited to a maximum of 16 participants.
The fee is CHF300 for doctoral students from EPFL and Empa, CHF500 for doctoral students from other academic institutions and CHF700 for other academic researchers. The registration fee for all other participants is CHF1500. Please note that payment is required upon registration via the PayOnline system through this link. Please do not register until you are ready to make the payment via credit card, Paypal or Twint. EPFL students may request to have the invoice sent directly to their lab.
Location
The course will be held at Empa Thun.
Accommodation
Travel and accommodation should be reserved and paid for directly by the participants.