Carbon coating is applied for SEM and TEM insulating samples. It is suitable for high resolution observation.
The use of Carbon Films in Electron Microscopy with their LOW background signal, and relatively good electrical conductivity is well known. Thin films, nominally 5nm or 50 Angstroms, are used in TEM, while a range of somewhat thicker films, ranging from 50nm or 500 Angstroms, may be used in SEM for such applications as X-Ray Microanalysis.