Imaging: Intelligence on the Nanoscale

Date     20 February 2020 at 16:00

Room   SV 1717

Chairs     Prof. Michael Unser (BIG) 

Contact     [email protected]  

Registration   https://epfl.doodle.com/poll/cp8pyh8hxfy6t2n3

 

Prof. Gabriel Aeppli  

Paul Scherrer Institut, Villigen, Switzerland 

Department of Physics, ETH Zürich

Institut de Physique, EPFL

 

Natural and artificial intelligence are defined by wiring diagrams for circuits implemented using proteins and silicon respectively. Remarkably, both biology and silicon chip fabrication are more advanced in their capacity to define the platforms for intelligence than is the technology for mapping the outcomes. Conventional high-resolution microscopy for imaging the interior of three- dimensional objects typically entails destructive sample preparation followed by electron microscopy of resulting surfaces or sections. Here we describe X-ray ptychography, a mixed real space/reciprocal space („wavelet“) technique, which is non-destructive and provides three-dimensional images at steadily improving resolution, which have now reached 15 nanometers. We show applications to integrated circuit inspection, with implications from quality control to security, and discuss impact on brain science.

 

References:
Nature 543, 402–406 (2017) http://www.nature.com/nature/journal/v543/n7645/abs/nature21698.html Nature Electronics 2, 464-470 (2019) https://www.nature.com/articles/s41928-019-0309-z