CCMX – ScopeM Advanced Course: Combining Structural & Analytical Investigations of Matter at the Micro-, Nano and Atomic Scale

5-8 November 2018 – ETH Zürich, Hönggerberg

This course focuses on morphological and analytical structure research methods through the use of electrons, photons and ions for material science.

Presentations focus on theoretical background knowledge and challenges for analytical imaging in various types of materials. Each lecture will contain a discussion on examples from the speakers’ own experiences or those from literature, including comments on the advantages, limitations and opportunities related to the methods discussed.

The course also features a special focus on sample preparation for analytical structure research in respect to resolution, sensitivity and the accuracy of each method. This theoretical part will be followed by demonstrations and instrument visits to deepen the gained knowledge in practical environments.


Monday, 5 November to Thursday, 8 November 2018


Room HPM H33 at the Hönggerberg campus of ETH Zürich.


Registration is now closed.

Lecturers and topics

Cécile Hébert (EPFL) – Introduction to the Course and to Analytical Microscopy; Analytical Electron Microscopy; Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtered Transmission Electron Microscopy (EFTEM)

Rolf Erni (Empa) – Basics of TEM and STEM imaging

Thomas Weber (ETH Zurich) – X-Ray Diffraction in Material Science

Renato Zenobi (ETH Zurich) –  Analytical Optical Spectroscopy & Microscopy

Marco Cantoni (EPFL) – Focused Ion Beam Scanning Electron Microscopy (FIBSEM)

Karsten Kunze (ETH Zurich) – Energy Dispersive X-Ray Spectroscopy (EDX) and Electron Backscatter Diffraction (EBSD)

Robin Schäublin – TEM Image Simulation

Stephan Gerstl (ETH Zurich) – Atom Probe Tomography

Fabian Gramm (ETH Zurich) – Electron Diffraction in TEM – Introduction and Applications

Ralph Spolenak (ETH Zurich) – Raman Spectrometry for Stress Analysis

Alla Sologubenko (ETH Zurich) – Microstructure and Phase Analyses in TEM

Marc Willinger (ETH Zurich) – In-situ Electron Microscopy

Max Döbeli (ETH Zurich) – Introduction to Secondary Ion Mass Spectrometry (SIMS)

Antonella Rossi (Università di Cagliari & ETH Zurich) – Auger Electron Spectroscopy and its Applications; XPS

Instrument Visits

The course will include visits to at least six and as many as eight instruments. Information on the various instrument visits is available below:

Station 1 Raman


Station 3_X-Ray Diffraction

Station 4_Analytical SEM

Station 5_Atom Probe

Station 6_HRSTEM

Station 7_HRTEM-EELS

Station 8 FIBSEM

Who should attend

The course target audience is PhD and Master students, industrial and academic researchers.

The number of participants is limited to a maximum of 32.

This course may be validated for 2 ECTS credits in the doctoral programmes of EPFL and ETH Zurich, after acceptance by the corresponding institution. In this case, full attendance and a final examination after the end of the course on the final day is required. Please contact Carey Sargent for details.

Participation Fees

PhD students from EPFL, ETH Zurich, PSI, Empa and CSEM: CHF 480.-

PhD students from other institutions and other academic participants: CHF 580.-

All other participants: CHF 2,000.-

Lunches and coffee breaks are included in the cost of participation. Participation of students coming from institutions outside of Switzerland will be confirmed only after all fees have been paid.

Cancellation Conditions

Participants are able to cancel their registration without penalty until 5 October 2018. A partial (50%) refund will be given to students who cancel after this date but before 19 October. No refund will be given to students who cancel after this date or who fail to show up to class.


Travel and accommodation should be reserved and paid for by the participants.

Contact Information

Carey Sargent
Phone: +41 21 693 46 56