2020 CCMX – ScopeM Course: Advanced Characterization of Materials at the Micro-, Nano and Atomic Scale

26 to 29 October, 2020

ETH Zürich, Hönggerberg

This course focuses on morphological and analytical techniques for complex studies of structural and functional materials using electrons, photons and ions. The lectures are accompanied by prolonged instrument visits and on-line demonstrations using real-life specimens to deepen the gained knowledge.

The lectures will cover the fundamentals and required background knowledge and also present the most typical challenges for material characterization on atomic, nano-, micro-, and millimeter scales. Each lecture will give real-life examples from the speakers’ own experiences or those from literature and will describe the advantages, limitations and opportunities related to the methods discussed.

The course also features a particular focus on the importance of the sample preparation routines  optimizing  resolution, sensitivity and the accuracy of each method.


ETHZ Hönggerberg. Details TBA.


Registration is only possible through the form found here.

Please note that payment is now required upon registration using the PayOnLine platform, which accepts major credit cards, PayPal and Twint. Course fees being paid directly by an EPFL laboratory may be paid by account transfer – please contact Carey Sargent if you are an EPFL student and prefer this method of payment.

Tuition, lunches and coffee breaks are included in the fees.

PhD students from EPFL, ETH Zurich, PSI, Empa and CSEM: CHF 480.-

PhD students from other institutions and other academic participants: CHF 780.-

All other participants: CHF 2,000.-

Lecturers and topics

Fundamentals of TEM/STEM imaging – Rolf Erni (Empa)

Analytical Electron Microscopy (EELS and EFTEM) – Cécile Hébert (EPFL)

Electron Diffraction in TEM – Fabian Gramm (ETHZ)

Microstructure and Phase Analyses in TEM –  Alla Sologubenko (ETHZ)

TEM Image Simulations – Robin Schäublin (ETHZ)

In-situ EM – Marc Willinger (ETHZ)

Analytical SEM (EDX and EBSD) – Karsten Kunze (ETHZ)

Focused Ion Beam Fundamentals and Applications – Joakim Reuteler (ETHZ)

Introduction to Secondary Ion Mass Spectrometry – Max Döbeli (ETHZ)

Atom Probe Tomography – Stephan Gerstl (ETHZ)

XRD in Material Science – Thomas Weber (ETHZ)

Raman Spectroscopy as Characterization of Semi-conductor Materials – Gabor Csucs (ETHZ)

Analytical Optical Spectroscopy & Microscopy – Renato Zenobi (ETHZ)

Fundamentals of Atomic Force Microscopy – Lucio Isa (ETHZ)

Instrument Visits

The course will include visits to eight instruments. Information on the various instrument visits is available below:

Station 1 X-ray diffraction

Station 2 Scanning Electron Microscopy

Station 3 Focused Ion Beam

Station 4 Raman

Station 5 Atom Probe

Station 6 In-situ EM/ Scanning TEM

Station 7 CTEM and analytical STEM

Station 8 High-resolution TEM simulations

Who should attend

The course target audience is PhD and Master students, industrial and academic researchers.

The number of participants is limited to a maximum of 32.

This course may be validated for 2 ECTS credits in the doctoral program of EPFL and ETH Zurich after acceptance by the corresponding institution. In this case, full attendance and a final examination after the end of the course on the final day is required. Please contact Carey Sargent for details.


Travel and accommodation should be reserved and paid for by the participants.

Contact Information

Carey Sargent
Phone: +41 21 693 46 56