The EELab offers electrical characterization facilities for the on-the-wafers, discrete and packaged electronic devices as well as integrated circuits. The EELab is equipped with several probe stations, some of which have variable temperature controllers (hot and cold chucks). All setups are provided with computers to manage and automate specific electrical measurements. The Lab offers the technical support for a wide range of the electrical measurements such as DC/AC, IV/CV analysis in the MHz-GHz range using Signal Generators, Spectrum Analyzers, LCR-meters and Semiconductor Parameter Analyzers.
To offer access to the electrical characterization equipment for semiconductor devices and integrated circuits.
To provide basic and advanced training on electrical characterization methods and techniques.
To gather and provide the most advanced know-how in the electrical characterization.
To cooperate with other academic institutions and research centers.